Datasheet

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ELECTRICAL CHARACTERISTICS
TSC2004
SBAS408E – JUNE 2007 – REVISED MARCH 2008
At T
A
= – 40 ° C to +85 ° C, SNSVDD = V
REF
= +1.2V to +3.6V, I/OVDD
(1)
= +1.2V to +3.6V, unless otherwise noted.
TSC2004
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
AUXILIARY ANALOG INPUT
Input voltage range 0 VREF V
Input capacitance 12 pF
Input leakage current – 1 +1 µ A
A/D CONVERTER
Resolution Programmable: 10 or 12 bits 12 Bits
No missing codes 12-bit resolution 11 Bits
Integral linearity – 3 – 0.8 to +1.4 +3 LSB
(2)
Differential linearity – 2 – 0.6 to +0.7 +4 LSB
TSC2004IRTJ – 5 2.2 5 LSB
SNSVDD = 1.6V, V
REF
= 1.6V,
Offset error
High-Speed mode, filter off
TSC2004IYZK 2.2 LSB
TSC2004IRTJ – 3 0.1 +3
SNSVDD = 1.6V, V
REF
= 1.6V,
Gain error LSB
High-Speed mode, filter off
TSC2004IYZK 0.1
REFERENCE INPUT
V
REF
range 1.2 SNSVDD V
Non-continuous AUX mode, SNSVDD = V
REF
= 1.6V,
VREF input current drain 1.2 µ A
T
A
= +25 ° C, f
ADC
= 2MHz, High-Speed mode
Input impedance A/D converter not converting 1 G Ω
TOUCH SENSORS
PENIRQ 50k Ω pull-up
T
A
= +25 ° C, SNSVDD = V
REF
= 1.6V 47 k Ω
resistor, R
IRQ
Y+, X+ T
A
= +25 ° C, SNSVDD = V
REF
= 1.6V 6 Ω
Switch
on-resistance
Y – , X – T
A
= +25 ° C, SNSVDD = V
REF
= 1.6V 5 Ω
Switch drivers drive
100ms duration 50 mA
current
(3)
INTERNAL TEMPERATURE SENSOR
Temperature range – 40 +85 ° C
SNSVDD = 1.6V 0.3 ° C/LSB
Differential method
(4)
SNSVDD = 3V 1.6 ° C/LSB
Resolution
SNSVDD = 1.6V 0.3 ° C/LSB
TEMP1
(5)
SNSVDD = 3V 1.6 ° C/LSB
SNSVDD = 1.6V ± 3 ° C/LSB
Differential method
(4)
SNSVDD = 3V ± 2 ° C/LSB
Accuracy
SNSVDD = 1.6V ± 3 ° C/LSB
TEMP1
(5)
SNSVDD = 3V ± 2 ° C/LSB
INTERNAL OSCILLATOR
SNSVDD = 1.2V, T
A
= +25 ° C 3.2 MHz
Clock frequency, f
OSC
SNSVDD = 1.6V 3.3 3.7 4.3 MHz
SNSVDD = 3.0V, T
A
= +25 ° C 4.1 MHz
SNSVDD = 1.2V 0.118 %/ ° C
Frequency drift SNSVDD = 1.6V – 0.018 %/ ° C
SNSVDD = 3.0V – 0.032 %/ ° C
(1) I/OVDD must be ≤ SNSVDD.
(2) LSB means Least Significant Bit. With V
REF
= +2.5V, one LSB is 610 µ V.
(3) Assured by design, but not tested. Exceeding 50mA source current may result in device degradation.
(4) Difference between TEMP1 and TEMP2 measurement; no calibration necessary.
(5) Temperature drift is – 2.1mV/ ° C.
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