Datasheet

C
L
(see Note A)
TEST CIRCUIT
S1
2 × V
DD
Open
GND
R
L
R
L
V
OH
V
OL
VOLTAGE WAVEFORMS
OUTPUT SKEW (t
sk(o)
)
Data Out at
YB
1
or YB
2
NOTES: A. C
L
includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤10 MHz, Z
O
= 50 Ω, t
r
≤ 2.5 ns, t
f
≤ 2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
50 Ω
V
G1
V
DD
DUT
50 Ω
V
SEL
50 Ω
V
G2
50 Ω
V
I
Input Generator
Input Generator
V
O
(V
OH
+ V
OL
)/2
V
OH
V
OL
Data Out at
XB
1
or XB
2
(V
OH
+ V
OL
)/2
3.5 V
1.5 V
Data In at
Ax or Ay
t
PLHx
t
PHLx
t
sk(o)
t
sk(o)
t
PLHy
t
PHLy
t
sk(o)
= t
PLHy
− t
PLHx
or t
PHLy
− t
PHLx
V
OH
V
OL
VOLTAGE WAVEFORMS
PULSE SKEW [t
sk(p)
]
Output
(V
OH
+ V
OL
)/2
Input
t
PLH
t
PHL
t
sk(p)
= t
PHL
− t
PLH
V
O
V
I
V
O
2.5 V
3.5 V
1.5 V
2.5 V
TEST
R
L
S1 C
L
3.3 V ± 0.3 V
V
CC
V
in
t
sk(p)
t
sk(o)
3.3 V ± 0.3V
Open
Open
200 Ω V
CC
or GND
V
CC
or GND
4 pF
4 pF
200 Ω
TS3DDR3812
SCDS314A –FEBRUARY 2011– REVISED MARCH 2011 www.ti.com
PARAMETER MEASUREMENT INFORMATION (continued)
Skew
Figure 6. Test Circuit andf Voltage Waveforms
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