Datasheet

C
L
(see Note A)
TEST CIRCUIT
S1
2 × V
DD
Open
GND
R
L
R
L
50 Ω
V
G1
V
DD
V
SEL
DUT
50 Ω
50 Ω
V
G2
50 Ω
V
I
TEST
R
L
S1 V
∆
C
L
V
DD
V
I
t
PLZ
/t
PZL
1.5 V to 2 V 2 × V
DD
200 Ω GND 10 pF 0.15 V
Input Generator
Input Generator
V
O
t
PHZ
/t
PZH
1.5 V to 2 V GND 200 Ω
V
DD
10 pF 0.15 V
t
PZL
V
OH
- 0.15 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
V
CC
/2
V
CC
/2
Output Control
(V
IN
)
V /2
DD
V
DD
V
OH
V
OL
+ 0.15 V
V
OH
V
OL
0 V
V
DD
/2
t
PZH
t
PLZ
t
PHZ
Output
Waveform 2
S1 at GND
(see Note B)
Output
Waveform 1
S1 at 2 V
CC
(see Note B)
V
OL
V
O
V
SEL
V
O
TS2PCIE412
SCDS269C –MARCH 2009–REVISED APRIL 2010 www.ti.com
PARAMETER MEASUREMENT INFORMATION
(Enable and Disable Times)
A. C
L
includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low, except when disabled by the output
control. Waveform 2 is for an output with internal conditions such that the output is high, except when disabled by the
output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, Z
O
= 50 Ω, t
r
≤ 2.5
ns, t
f
≤2.5 ns.
D. The outputs are measured one at a time, with one transition per measurement.
E. t
PLZ
and t
PHZ
are the same as t
dis
.
F. t
PZL
and t
PZH
are the same as t
en
.
Figure 6. Test Circuit and Voltage Waveforms
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