Datasheet

TRS202E
SLLS847D –JULY 2007–REVISED NOVEMBER 2012 www.ti.com
DRIVER SECTION
Electrical Characteristics
(1)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 5)
PARAMETER TEST CONDITIONS MIN TYP
(2)
MAX UNIT
V
OH
High-level output voltage D
OUT
at R
L
= 3 kΩ to GND, D
IN
= GND 5 9 V
V
OL
Low-level output voltage D
OUT
at R
L
= 3 kΩ to GND, D
IN
= V
CC
–5 –9 V
I
IH
High-level input current V
I
= V
CC
15 200 μA
I
IL
Low-level input current V
I
at 0 V –15 –200 μA
I
OS
(3)
Short-circuit output current V
CC
= 5.5 V V
O
= 0 V ±10 ±60 mA
r
o
Output resistance V
CC
, V+, and V– = 0 V V
O
= ±2 V 300 Ω
(1) Test conditions are C1–C4 = 0.1 μF at V
CC
= 5 V + 0.5 V.
(2) All typical values are at V
CC
= 5 V, and T
A
= 25°C.
(3) Short-circuit durations should be controlled to prevent exceeding the device absolute power-dissipation ratings, and not more than one
output should be shorted at a time.
Switching Characteristics
(1)
over recommended ranges of suply voltage and operating free-air temperature (unless otherwise noted) (see Figure 5)
PARAMETER TEST CONDITIONS MIN TYP
(2)
MAX UNIT
C
L
= 50 to 1000 pF, R
L
= 3 kΩ to 7 kΩ,
Maximum data rate 120 kbit/s
One D
OUT
switching, See Figure 2
Propagation delay time, low- to high- C
L
= 2500 pF, R
L
= 3 kΩ,
t
PLH(D)
2 μs
level output All drivers loaded, See Figure 2
Propagation delay time, high- to low- C
L
= 2500 pF, R
L
= 3 kΩ,
t
PHL(D)
2 μs
level output All drivers loaded, See Figure 2
R
L
= 3 kΩ to 7 kΩ,
t
sk(p)
Pulse skew
(3)
C
L
= 150 to 2500 pF, 300 ns
See Figure 3
Slew rate, transition region C
L
= 50 to 1000 pF,
SR(tr) R
L
= 3 kΩ to 7 kΩ, 3 6 30 V/μs
(see Figure 2) V
CC
= 5 V
(1) Test conditions are C1–C4 = 0.1 μF at V
CC
= 5 V + 0.5 V.
(2) All typical values are at V
CC
= 5 V, and T
A
= 25°C.
(3) Pulse skew is defined as |t
PLH
– t
PHL
| of each channel of the same device.
ESD Protection
PIN TEST CONDITIONS TYP UNIT
Human-Body Model ±15
D
OUT
, R
IN
Contact Discharge ±8 kV
Air-gap Discharge ±15
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