Datasheet

TPS7A7200
SBVS136E –MARCH 2012–REVISED SEPTEMBER 2013 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
PRODUCT Description
TPS7A7200yyyz YYY is package designator.
Z is package quantity.
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
VALUE
MIN MAX UNIT
IN, PG, EN –0.3 +7.0 V
Voltage SS, FB, SNS, OUT –0.3 V
IN
+ 0.3
(2)
V
50mV, 100mV, 200mV, 400mV, 800mV, 1.6V –0.3 V
OUT
+ 0.3 V
OUT Internally limited A
Current
PG (sink current into IC) 5 mA
Operating virtual junction, T
J
–55 +150 °C
Temperature
Storage, T
stg
–55 +150 °C
Human body model (HBM, JESD22-A114A) 2 kV
Electrostatic Discharge Rating
(3)
Charged device model (CDM, JESD22-C101B.01) 500 V
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-
maximum-rated conditions for extended periods may affect device reliability.
(2) The absolute maximum rating is V
IN
+ 0.3 V or +7.0 V, whichever is smaller.
(3) ESD testing is performed according to the respective JESD22 JEDEC standard.
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