Datasheet
TPS7A4700
TPS7A4701
SBVS204E –JUNE 2012–REVISED JANUARY 2014
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE AND ORDERING INFORMATION
(1)
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
Over operating free-air temperature range, unless otherwise noted.
(1)
MIN MAX UNIT
IN pin to GND pin –0.4 +36 V
EN pin to GND pin –0.4 +36 V
EN pin to IN pin –36 +0.4 V
OUT pin to GND pin –0.4 +36 V
NR pin to GND pin –0.4 +36 V
SENSE/FB pin to GND pin –0.4 +36 V
0P1V pin to GND pin –0.4 +36 V
Voltage
(2)
0P2V pin to GND pin –0.4 +36 V
0P4V pin to GND pin –0.4 +36 V
0P8V pin to GND pin –0.4 +36 V
1P6V pin to GND pin –0.4 +36 V
3P2V pin to GND pin –0.4 +36 V
6P4V1 pin to GND pin –0.4 +36 V
6P4V2 pin to GND pin –0.4 +36 V
Current Peak output Internally limited
Operating virtual junction, T
J
–40 +125 °C
Temperature
Storage, T
stg
–65 +150 °C
Human body model (HBM)
1000 V
QSS 009-105 (JESD22-A114A)
TPS7A4700
Charge device model (CDM)
500 V
QSS 009-147 (JESD22-C101B.01)
Electrostatic discharge (ESD) ratings
(3)
Human body model (HBM)
2500 V
QSS 009-105 (JESD22-A114A)
TPS7A4701
Charge device model (CDM)
500 V
QSS 009-147 (JESD22-C101B.01)
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages are with respect to network ground terminal.
(3) ESD testing is performed according to the respective JESD22 JEDEC standard.
2 Submit Documentation Feedback Copyright © 2012–2014, Texas Instruments Incorporated
Product Folder Links: TPS7A4700 TPS7A4701