Datasheet

TPS795xx
SLVS350H –OCTOBER 2002–REVISED AUGUST 2010 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
PRODUCT V
OUT
(2)
TPS795xx yyy z XX is nominal output voltage (for example, 28 = 2.8 V, 285 = 2.85 V, 01 = Adjustable).
YYY is package designator.
Z is package quantity.
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
website at www.ti.com.
(2) Output voltages from 1.3 V to 5.0 V in 100 mV increments are available; minimum order quantities may apply. Contact factory for details
and availability.
ABSOLUTE MAXIMUM RATINGS
over operating temperature (unless otherwise noted)
(1)
VALUE
V
IN
range –0.3 V to 6 V
V
EN
range –0.3 V to V
IN
+ 0.3 V
V
OUT
range 6 V
Peak output current Internally limited
ESD rating, HBM 2 kV
ESD rating, CDM 500 V
Continuous total power dissipation See the Thermal Information Table
Junction temperature range, T
J
–40°C to +150°C
Storage temperature range, T
stg
–65°C to +150°C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
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