Datasheet

TPS7101Q, TPS7133Q, TPS7148Q, TPS7150Q
TPS7101Y, TPS7133Y, TPS7148Y, TPS7150Y
LOW-DROPOUT VOLTAGE REGULATORS
SLVS092G NOVEMBER 1994 REVISED JANUARY 2003
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
TPS7133 electrical characteristics at I
O
= 10 mA, V
I
= 4.3 V, EN = 0 V, C
O
= 4.7 µF/CSR
= 1 , SENSE
shorted to OUT (unless otherwise noted)
PARAMETER
TEST CONDITIONS
TPS7133Q
UNIT
PARAMETER
TEST
CONDITIONS
J
MIN TYP MAX
UNIT
Out
p
ut voltage
V
I
= 4.3 V, I
O
= 10 mA 25°C 3.3
V
Output
voltage
4.3 V V
I
10 V, 5 mA I
O
500 mA 40°C to 125°C 3.23 3.37
V
I
O
=10mA
V
I
= 3 23 V
25°C 4.5 7
I
O
=
10
mA
,
V
I
=
3
.
23
V
40°C to 125°C 8
Dropout voltage
I
O
= 100 mA
V
I
= 3 23 V
25°C 47 60
mV
D
ropou
t
vo
lt
age
I
O
=
100
mA
,
V
I
=
3
.
23
V
40°C to 125°C 80
mV
I
O
= 500 mA
V
I
= 3 23 V
25°C 235 300
I
O
=
500
mA
,
V
I
=
3
.
23
V
40°C to 125°C 400
Pass element series resistance
(3.23 V V
O
)/I
O
, V
I
= 3.23 V,
25°C 0.47 0.6
Pass
-
element
series
resistance
(
O
)
O
,
I
O
= 500 mA
I
,
40°C to 125°C 0.8
In
p
ut regulation
V
I
=43Vto10V
50 µA I
O
500 mA
25°C 20
mV
Input
regulation
V
I
=
4
.
3
V
to
10
V
,
50
µ
A
I
O
500
mA
40°C to 125°C 27
mV
I
O
=5mAto500mA
43VV
I
10 V
25°C 21 38
mV
Out
p
ut regulation
I
O
=
5
mA
to
500
mA
,
4
.
3
V
V
I
10
V
40°C to 125°C 75
mV
Output
regulation
I
O
=50µA to 500 mA
43VV
I
10 V
25°C 30 60
mV
I
O
=
50
µ
A
to
500
mA
,
4
.
3
V
V
I
10
V
40°C to 125°C 120
mV
I
O
=50µA
25°C 43 54
Ri
pp
le rejection
f = 120 Hz
I
O
=
50
µ
A
40°C to 125°C 40
dB
Ripple
rejection
f
=
120
Hz
I
O
= 500 mA
25°C 39 49
dB
I
O
=
500
mA
40°C to 125°C 36
Output noise-spectral density f = 120 Hz 25°C 2
µV/Hz
10 H f 100 kH
C
O
= 4.7 µF
25°C 274
Output noise voltage
10 Hz f 100 kHz,
CSR
=
1
C
O
= 10 µF
25°C 228
µVrms
CSR
=
1
C
O
= 100 µF
25°C 159
PG trip-threshold voltage
V
O
voltage decreasing from above V
PG
40°C to 125°C 2.868 3 V
PG hysteresis voltage
25°C 35 mV
PG out
p
ut low voltage
I
PG
=1mA
V
I
=28V
25°C 0.22 0.4
V
PG
output
low
voltage
I
PG
=
1
mA
,
V
I
=
2
.
8
V
40°C to 125°C 0.4
V
CSR refers to the total series resistance, including the ESR of the capacitor, any series resistance added externally, and PWB trace resistance
to C
O
.
Pulse-testing techniques are used to maintain virtual junction temperature as close as possible to ambient temperature; thermal effects must
be taken into account separately.