Datasheet

DIGITAL
nRESET
from system host / uC
from system host / uC
PWR_EN
SYS
22m
Q1
from USB connector
USB
Q2
Lin Charger &
Power Path
MGMT
Single cell
Li+ Battery
10m
BAT
BAT_SENSE
to system load
4.7m
Q1
from USB connector
AC
4.7m
NTC
TS
TEMP SENSE
PGND
VLDO1
to system
VLDO2
to system
2.2m
2.2m
SYS
4.7m
VINDO
LDO1
LDO2
SDA
from system host / uC
I2C
SCL
from system host / uC
VIO
VIO
BIAS
10m
100n
BYPASS
INT_LDO
WLED
Driver
4.7m
ISINK1
L4
FB_WLED
SYS
ISET1
ISINK2
ISET2
AGND
PB_IN
Momentatary Push Button
Always-on
supply
Up to 2x 10 LEDs
100k
Always-on
supply
100k
PGOOD
LDO_PGOOD
to system host / uC
to system host / uC
MUX
to system host / uC
100n
MUX_OUT
VBAT
VSYS
VICHARGE
VTS
from system
MUX_IN
nWAKEUP
nINT
to system host / uC
to system host / uC
100k
100k VIO (always on)
VIO
I/O Voltage
VIO (always on)
VDCDC1
L1
to system
10m
SYS
4.7m
VIN_DCDC1
DCDC1
VDCDC2
L2
10m
DCDC2
to system
SYS
4.7m
VIN_DCDC2
to system
VDCDC3
L3
10m
SYS
4.7m
VIN_DCDC3
DCDC3
from 1.8V-5.8V supply
to system load
LS2_IN
LS2_OUT
from 1.8V-5.8V supply
to system load
LS1_IN
LS1_OUT
10m
10m
LOAD SW2 /
LDO4
LOAD SW1/
LDO3
TPS65217A, TPS65217B, TPS65217C, TPS65217D
www.ti.com SLVSB64F –NOVEMBER 2011–REVISED APRIL 2013
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FUNCTIONAL BLOCK DIAGRAM
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Product Folder Links: TPS65217A TPS65217B TPS65217C TPS65217D