Datasheet
TPS54331
SLVS839D –JULY 2008– REVISED JANUARY 2012
www.ti.com
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
DESCRIPTION CONTINUED
For additional design needs, see:
TPS54231 TPS54232 TPS54233 TPS54331 TPS54332
I
O
(Max) 2A 2A 2A 3A 3.5A
Input Voltage Range 3.5V - 28V 3.5V - 28V 3.5V - 28V 3.5V - 28V 3.5V - 28V
Switching Freq. (Typ) 570kHz 1000kHz 285kHz 570kHz 1000kHz
Switch Current Limit (Min) 2.3A 2.3A 2.3A 3.5A 4.2A
8SOIC
Pin/Package 8SOIC 8SOIC 8SOIC 8SO PowerPAD™
8SO PowerPAD™
ORDERING INFORMATION
(1)
T
J
PACKAGE SWITCHING FREQUENCY PART NUMBER
(2)
8 pin SOIC 570 kHz TPS54331D
–40°C to 150°C
8 pin SOIC PowerPAD™ 570 kHz TPS54331DDA
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) The D and DDA packages are also available taped and reeled. Add an R suffix to the device type (i.e., TPS54331DR). See applications
section of data sheet for layout information.
ABSOLUTE MAXIMUM RATINGS
(1)
over operating free-air temperature range (unless otherwise noted)
VALUE UNIT
VIN –0.3 to 30
EN –0.3 to 6
BOOT 38
Input Voltage V
VSENSE –0.3 to 3
COMP –0.3 to 3
SS –0.3 to 3
BOOT-PH 8
Output Voltage PH –0.6 to 30 V
PH (10 ns transient from ground to negative peak) –5
EN 100 μA
BOOT 100 mA
Source Current
VSENSE 10 μA
PH 9 A
VIN 9 A
Sink Current COMP 100
μA
SS 200
Electrostatic Human body model (HBM) 2 kV
Discharge
Charged device model (CDM) 500 V
Operating Junction Temperature –40 to 150 °C
Storage Temperature –65 to 150 °C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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