Datasheet

TPS54320
SLVS982A –AUGUST 2010–REVISED SEPTEMBER 2010 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
T
J
PACKAGE PART NUMBER
(2)
–40°C to 150°C 14 Pin QFN TPS54320RHL
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) The RHL package is also available taped and reeled. Add an R suffix to the device type (i.e., TPS54320RHLR). See applications section
of data sheet for layout information.
ABSOLUTE MAXIMUM RATINGS
(1)
over operating temperature range (unless otherwise noted)
VALUE UNIT
VIN –0.3 to 20 V
PVIN –0.3 to 20 V
EN –0.3 to 6 V
BOOT –0.3 to 27 V
Input Voltage VSENSE –0.3 to 3 V
COMP –0.3 to 3 V
PWRGD –0.3 to 6 V
SS/TR –0.3 to 3 V
RT/CLK –0.3 to 6 V
BOOT-PH 0 to 7 V
Output Voltage PH –1 to 20 V
PH 10ns Transient –3 to 20 V
Vdiff GND to exposed thermal pad –0.2 to 0.2 V
RT/CLK ±100 mA
Source Current
PH Current Limit A
PH Current Limit A
PVIN Current Limit A
Sink Current
COMP ±200 mA
PWRGD –0.1 to 5 mA
Electrostatic Discharge (HBM) QSS 009-105 (JESD22-A114A) 2 kV
Electrostatic Discharge (CDM) QSS 009-147 (JESD22-C101B.01) 500 V
Operating Junction Temperature –40 to 150 °C
Storage Temperature –65 to 150 °C
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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