Datasheet
TPS53313
SLUSAS8 –DECEMBER 2011
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)(2)
ORDERABLE OUTPUT
T
A
PACKAGE PINS MINIMUM QUANTITY ECO PLAN
DEVICE NUMBER SUPPLY
TPS53313RGER 24 Tape and reel 3000
Plastic QFN Green (RoHS and no
–40°C to 85°C
(RGE) Pb/Br)
TPS53313RGET 24 Mini reel 250
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the TI
website at www.ti.com.
(2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at
www.ti.com/sc/package
ABSOLUTE MAXIMUM RATINGS
(1)(2)(3)
Over operating free air-temperature range (unless otherwise noted)
VALUE
UNIT
MIN MAX
VIN –0.3 20.0
VBST –0.3 27.0
VBST to SW –0.3 7.0
DC –2 20
Input voltage range SW (bidirectional) V
transient < 20 ns –3 20
V
VIN
≥ 17 –0.3 17.0
EN
V
VIN
< 17 –0.3 V
VIN
+0.1
FB, MODE/SS –0.3 3.6
COMP, RT/SYNC, BP3 –0.3 3.6
Output voltage range BP7 –0.3 7.0 V
PGD –0.3 17.0
Output Current 6 A
Ground Pins GND –0.3 0.3 V
Human Body Model (HBM) 2000
Electrostatic Discharge V
Charged Device Model (CDM) 500
Storage temperature, T
stg
–55 150 °C
Operating temperature, T
J
–40 150 °C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 300 C
(1) Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to the network ground terminal unless otherwise noted.
(3) Voltage values are with respect to the corresponding LL terminal.
2 Copyright © 2011, Texas Instruments Incorporated