Datasheet

4 Test Setup
4.1 Equipment
4.1.1 Voltage Source
4.1.2 Voltmeters
4.1.3 Loads
4.1.4 Oscilloscope
4.1.5 Fan
Test Setup www.ti.com
This section shows the test setups used and the tests performed in evaluating the EVM. See the
TPS51120 data sheet (SLUS670 ) for complete details regarding the operation and specifications.
Table 2. I/O and Jumper Connections
JACK CONNECTION
The input voltage source 1 should be a 0 V to 10 V variable DC source capable of supplying 1Adc. Connect Vin to
VIN
J1 as shown in Figure 3 .
The input voltage source 2 should be a 0 V to 10 V variable DC source capable of supplying 1Adc. Connect
VDDQ
VDDQ to J2 as shown in Figure 3 .
The input voltage source 3 should be a 0 V to 10 V variable DC source capable of supplying 10Adc. Connect
VLDOIN
VLDOIN to J3 as shown in Figure 3 .
The input voltage source 4 should be a 0-10V variable DC source capable of supplying 1Adc. Connect 5VINPUT
5VINPUT
to J6 as shown in Figure 3 .
Voltmeters (0V-10 V) are used to monitor the V
IN
voltage (V1), VDDQ input voltage (V2), VLDOIN input
voltage (V3), VTT output voltage (V4), VTTREF output voltage (V5), 5VIN input (V6) as shown in Figure 3
Load 1 is an electronic load set in constant current mode capable of sinking 0 A to 5 A of current. Load 1
needs to be connected to J5 as shown in Figure 3 . Load 2 is recommended to use resistive load around
0.5 W. VTTREF only sink/source maximum 10 mA. Load 2 needs to be connected to J4 as shown in
Figure 3 .
An analog or digital oscilloscope can be used to monitor various test points around the EVM. It also can
be used to measure VTT transient load regulation.
Some of the components in this EVM can get hot to approach temperatures of 60 ° C during operating. A
small fan capable of between 200 LFM and 400 LFM is recommended to reduce component temperatures
while the EVM is operating.
Using theTPS51200 EVM Sink/Source DDR Termination Regulator6 SLUU323 – JUNE 2008
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