Datasheet

TPS3808-Q1
SBVS085H –JANUARY 2007–REVISED JUNE 2012 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
NOMINAL THRESHOLD
ORDERABLE TOP-SIDE
T
J
SUPPLY VOLTAGE PACKAGE
(2)
PART NUMBER MARKING
VOLTAGE (V
IT
)
SON – DRV Reel of 3000 TPS3808G01QDRVRQ1 PSJQ
Adjustable 0.405 V
SOT-23 – DBV Reel of 3000 TPS3808G01QDBVRQ1 BAZ
1.25 V 1.16 V TPS3808G125QDBVRQ1 QWZ
1.2 V 1.12 V TPS3808G12QDBVRQ1 CEM
–40°C to 125°C 1.5 V 1.4 V TPS3808G15QDBVRQ1 OFR
1.8 V 1.67 V SOT-23 – DBV Reel of 3000 TPS3808G18QDBVRQ1 OBZ
3 V 2.79 V TPS3808G30QDBVRQ1 AVP
3.3 V 3.07 V TPS3808G33QDBVRQ1 AVQ
5 V 4.65 V TPS3808G50QDBVRQ1 CEL
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
ABSOLUTE MAXIMUM RATINGS
over operating junction temperature range (unless otherwise noted)
(1)
V
DD
Input voltage range –0.3 V to 7 V
V
CT
C
T
voltage range –0.3 V to (V
DD
+ 0.3) V
V
MR
,
V
RESET
, MR, RESET, SENSE voltage ranges –0.3 V to 7 V
V
SENSE
I
RESET
RESET pin current 5 mA
T
J
Operating junction temperature range
(2)
–40°C to 150°C
T
stg
Storage temperature range –65°C to 150°C
Human-Body Model (HBM) 2 kV
TPS3808GXX 500 V
Charged-Device Model (CDM)
ESD Electrostatic discharge rating
TPS3808G125QDBVRQ1 1000 V
Machine Model (MM),
50 V
TPS3808G01QDRVRQ1,TPS3808G125QDBVRQ1
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under the Electric Characteristics is
not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Due to the low dissipated power in this device, it is assumed that T
J
= T
A
.
2 Copyright © 2007–2012, Texas Instruments Incorporated