Datasheet

ABSOLUTE MAXIMUM RATINGS
(1)
TPS3808
SBVS050J MAY 2004 REVISED AUGUST 2008 ..........................................................................................................................................................
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
PRODUCT NOMINAL SUPPLY VOLTAGE
(2)
THRESHOLD VOLTAGE (V
IT
)
TPS3808G01 Adjustable 0.405V
TPS3808G09 0.9V 0.84V
TPS3808G12 1.2V 1.12V
TPS3808G125 1.25V 1.16V
TPS3808G15 1.5V 1.40V
TPS3808G18 1.8V 1.67V
TPS3808G19 1.9V 1.77V
TPS3808G25 2.5V 2.33V
TPS3808G30 3.0V 2.79V
TPS3808G33 3.3V 3.07V
TPS3808G50 5.0V 4.65V
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com .
(2) Custom threshold voltages from 0.82V to 3.3V, 4.4V to 5.0V are available through the use of factory EEPROM programming. Minimum
order quantities apply. Contact factory for details and availability.
Over operating junction temperature range, unless otherwise noted.
TPS3808 UNIT
Input voltage range, V
DD
0.3 to 7.0 V
C
T
voltage range, V
CT
0.3 to V
DD
+ 0.3 V
Other voltage ranges: V
RESET
, V
MR
, V
SENSE
0.3 to 7 V
RESET pin current 5 mA
Operating junction temperature range, T
J
(2)
40 to +150 ° C
Storage temperature range, T
STG
65 to +150 ° C
ESD rating, HBM 2 kV
ESD rating, CDM 500 V
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under the Electrical Characteristics
is not implied. Exposure to absolute maximum rated conditions for extended periods may affect device reliability.
(2) As a result of the low dissipated power in this device, it is assumed that T
J
= T
A
.
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