Datasheet

TPS2554
TPS2555
SLVSAM0 – JUNE 2011 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted
(1) (2)
VALUE UNIT
Voltage range on IN, OUT, EN or EN, ILIM0, ILIM1, ILIM_SEL, FAULT –0.3 to 7
V
Voltage range from IN to OUT –7 to 7
I
OUT
Continuous output current Internally limited
Continuous total power dissipation Internally limited
Continuous FAULT sink current 25
mA
ILIM source current Internally limited
HBM 2 kV
ESD
CDM 500 V
T
J
Maximum junction temperature –40 to OTSD2
(3)
°C
T
stg
Storage temperature range -65 to 150
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Voltages are referenced to GND unless otherwise noted.
(3) Ambient over-temperature shutdown threshold.
RECOMMENDED OPERATING CONDITIONS
MIN MAX UNIT
V
IN
Input voltage, IN 4.5 5.5
V
V
EN
, V
EN
,
Logic-level inputs 0 5.5
ILIM_SEL
I
OUT
Continuous output current, OUT 0 2.5 A
T
J
Operating virtual junction temperature –40 125 °C
R
ILIM
Recommended resistor limit range 16.9 750 kΩ
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