Datasheet
AVAILABLE OPTIONS
ABSOLUTE MAXIMUM RATINGS
DISSIPATION RATING TABLE
(1)
data sheet
TPS2375
TPS2376
TPS2377
SLVS525B – APRIL 2004 – REVISED APRIL 2008 ............................................................................................................................................................
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
UVLO THRESHOLDS (NOMINAL) PACKAGE
(1)
T
A
MARKING
TYPE LOW HIGH SO-8 TSSOP-8
802.3af 30.5 V 39.3 V TPS2375D TPS2375PW 2375
-40 ° C to 85 ° C Adjustable 1.93 V 2.49 V TPS2376D TPS2376PW 2376
Legacy 30.5 V 35.1 V TPS2377D TPS2377PW 2377
(1) Add an R suffix to the device type for tape and reel.
over operating free-air temperature range (unless otherwise noted)
(1)
, voltages are referenced to V
(VSS)
TPS237x
VDD, RTN, DET, PG
(2)
-0.3 V to 100 V
Voltage ILIM, UVLO -0.3 V to 10 V
CLASS -0.3 V to 12 V
RTN
(3)
0 to 515 mA
Current, sinking PG 0 to 5 mA
DET 0 to 1 mA
CLASS 0 to 50 mA
Current, sourcing
ILIM 0 to 1 mA
Human body model 2 kV
ESD Charged device model 500 V
System level (contact/air) at RJ-45
(4)
8/15 kV
T
J
Maximum junction temperature range Internally limited
T
stg
Storage temperature range -65 ° C to 150 ° C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds - Green Packages 260 ° C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds - Nongreen Packages 235 ° C
(1) Stresses beyond those listed under “ absolute maximum ratings ” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “ recommended operating
conditions ” is not implied. Exposure to absolute – maximum – rated conditions for extended periods may affect device reliability.
(2) I
(RTN)
= 0
(3) SOA limited to V
(RTN)
= 80 V and I
(RTN)
= 515 mA.
(4) Surges applied to RJ-45 of Figure 1 between pins of RJ-45, and between pins and output voltage rails per EN61000-4-2, 1999.
POWER RATING
θ
JA
(LOW-K) θ
JA
(HIGH-K) (HIGH-K)
PACKAGE
° C/W ° C/W T
A
= 85 ° C
mW
D (SO-8) 238 150 266
PW (TSSOP-8) 258.5 159 251
(1) Tested per JEDEC JESD51. High-K is a (2 signal – 2 plane) test board and low-K is a double sided
board with minimum pad area and natural convection.
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Product Folder Link(s): TPS2375 TPS2376 TPS2377