Datasheet

Laser Marking View
Bump View
B
2 1
A
B
1 2
A
V
IN
ON
V
OUT
GND
Control
Logic
A2
B2
B1
A1
TPS22907
SLVSA44A –NOVEMBER 2009–REVISED SEPTEMBER 2013 www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
For detailed ordering information, see the PACKAGE OPTION ADDENDUM section at the end of this data sheet.
FUNCTIONAL BLOCK DIAGRAM
YZT PACKAGE
FUNCTION TABLE
ON (Control Input) V
IN
to V
OUT
L OFF
H ON
TERMINAL FUNCTIONS
TERMINAL
DESCRIPTION
BALL NO. NAME
A1 V
OUT
Switch output
A2 V
IN
Switch input, bypass capacitor recommended for minimizing V
IN
dip. See Application Information.
B1 GND Ground
B2 ON Switch control input, active high. Do not leave floating.
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