Datasheet
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DESCRIPTION (CONTINUED)
ABSOLUTE MAXIMUM RATINGS
TPA6112A2
SLOS342A – DECEMBER 2000 – REVISED SEPTEMBER 2004
These devices have limited built-in ESD protection. The leads should be shorted together or the device
placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates.
THD+N when driving an 16- Ω load from 5 V is 0.03% at 1 kHz, and less than 1% across the audio band of 20 Hz
to 20 kHz. For 32- Ω loads, the THD+N is reduced to less than 0.02% at 1 kHz, and is less than 1% across the
audio band of 20 Hz to 20 kHz. For 10-k Ω loads, the THD+N performance is 0.005% at 1 kHz, and less than
0.5% across the audio band of 20 Hz to 20 kHz.
AVAILABLE OPTIONS
PACKAGED DEVICE
T
A
MSOP SYMBOLIZATION
MSOP
(1)
-40 ° C to 85 ° C TPA6112A2DGQ TI APD
(1) The DGQ package isavailable in left-ended tape and reel only (e.g., TPA6112A2DGQR).
Terminal Functions
TERMINAL
I/O DESCRIPTION
NAME NO
BYPASS 4 I Tap to voltage divider for internal mid-supply bias supply. Connect to a 0.1 µF to 1 µF low ESR capacitor
for best performance.
GND 5 I GND is the ground connection.
IN1- 2 I IN1- is the negative input for channel 1.
IN1+ 3 I IN1+ is the positive input for channel 1.
IN2- 8 I IN2- is the negative input for channel 2.
IN2+ 7 I IN2+ is the positive input for channel 2.
SHUTDOWN 6 I Puts the device in a low quiescent current mode when held high.
V
DD
10 I V
DD
is the supply voltage terminal.
V
O
1 1 O V
O
1 is the audio output for channel 1.
V
O
2 9 O V
O
2 is the audio output for channel 2.
over operating free-air temperature (unless otherwise noted
(1)
)
UNITS
V
DD
Supply voltage 6 V
V
I
Input voltage -0.3 V to V
DD
+ 0.3 V
Continuous total power dissipation internally limited
T
J
Operating junction temperature range -40 ° C to 150 ° C
T
stg
Storage temperature range -65 ° C to 150 ° C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260 ° C
(1) Stresses beyond thoselisted under absolute maximum ratings may cause permanent damage to the device.These are stress ratings
only, and functional operation of the device at theseor any other conditions beyond those indicated under recommended
operatingconditions is not implied. Exposure to absolute-maximum-rated conditions forextended periods may affect device reliability.
2