Datasheet

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Gate
Drive
_
+
Gate
Drive
_
+
_
+
_
+
Gain
Adjust
Gain
Adjust
Start-Up
Protection
Logic
OC
Detect
Thermal V
DD
ok
Ramp
Generator
Biases
and
References
Gain
2
AGNDV
DD
V
DD
PV
DD
INN
OUTN
PGND
PV
DD
OUTP
PGND
INP
SHUTDOWN
GAIN1
GAIN0
COSC
ROSC
BYPASS
_
+
_
+
Deglitch
Logic
Deglitch
Logic
TPA2000D1
SLOS328F – JUNE 2000 – REVISED MARCH 2004
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated
circuits be handled with appropriate precautions. Failure to observe proper handling and installation
procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision
integrated circuits may be more susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
AVAILABLE OPTIONS
PACKAGED DEVICES
T
A
TSSOP (PW)
(1)
GQC
(2)
40°C to 85°C TPA2000D1PW TPA2000D1GQCR
(1) The PW package is available taped and reeled. To order a taped
and reeled part, add the suffix R to the part number (e.g.,
TPA2000D1PWR).
(2) The GQC package is only available taped and reeled.
FUNCTIONAL BLOCK DIAGRAM
2