Datasheet
SPRS161K − MARCH 2001 − REVISED JULY 2007
5
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TMS320x240xA device summary
Table 1. Device Feature Comparison Between Lx2401A and Lx2402A
FEATURE LF2401A LC2401A LF2402A LC2402A
C2xx DSP Core Yes Yes Yes Yes
Instruction Cycle 25 ns 25 ns 25 ns 25 ns
MIPS (40 MHz) 40 MIPS 40 MIPS 40 MIPS 40 MIPS
RAM (16-bit word)
Dual-Access
RAM (DARAM)
544 544 544 544
RAM (16-bit word)
Single-Access
RAM (SARAM)
512 512 512 —
3.3-V Flash (Program Space, 16-bit word) 8K — 8K —
Flash Sectors 4K/4K — 4K/4K —
On-chip ROM (Program Space, 16-bit word) — 8K — 6K
Code Security for On-Chip Flash/ROM Yes Yes Yes Yes
Boot ROM Yes Yes Yes —
External Memory Interface — — — —
Event Manager A (EVA) EVA EVA EVA EVA
S General-Purpose (GP) Timers 2 2 2 2
S Compare (CMP)/PWM 7 7 8 8
S Capture (CAP)/QEP 1 1 3/2 3/2
S Input qualifier circuitry on
PDPINTx
, CAPn, XINT1/2, and
ADCSOC pins
Yes
†
Yes
†
Yes Yes
Watchdog Timer Yes Yes Yes Yes
10-Bit ADC Yes Yes Yes Yes
S Channels 5 5 8 8
S Conversion Time (minimum) 500 ns 500 ns 500 ns 500 ns
SPI — — — —
SCI Yes Yes Yes Yes
CAN — — — —
Digital I/O Pins (Shared) 13 13 21 21
External Interrupts 2 2 3 3
Supply Voltage
Core 3.3 V 3.3 V 3.3 V 3.3 V
Supply Voltage
I/O 3.3 V 3.3 V 3.3 V 3.3 V
Packaging 32-pin VF 32-pin VF 64-pin PG 64-pin PG
Product Status
‡
:
Product Preview (PP)
Advance Information (AI)
Production Data (PD)
PD PD PD PD
†
Some pins may not be applicable to Lx2401A.
‡
PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice.
ADVANCE INFORMATION concerns new products in the sampling or preproduction phase of development. Characteristic data and other
specifications are subject to change without notice.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include testing of all parameters.