Datasheet

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SDA
V+
ADD0
SCL
GND
ALERT
CBZ
TMP102
SBOS397C AUGUST 2007REVISED OCTOBER 2012
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
PRODUCT PACKAGE-LEAD PACKAGE DESIGNATOR PACKAGE MARKING
TMP102 SOT563 DRL CBZ
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
PARAMETER TMP102 UNIT
Supply Voltage 3.6 V
Input Voltage
(2)
–0.5 to +3.6 V
Operating Temperature –55 to +150 °C
Storage Temperature –60 to +150 °C
Junction Temperature +150 °C
Human Body Model (HBM) 2000 V
ESD Rating Charged Device Model (CDM) 1000 V
Machine Model (MM) 200 V
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Input voltage rating applies to all TMP102 input voltages.
PIN CONFIGURATION
DRL Package
SOT563
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