Datasheet

RM46L450
RM46L850
www.ti.com SPNS184A –SEPTEMBER 2012–REVISED SEPTEMBER 2013
4.6.3 Clock Test Mode
The RM4x platform architecture defines a special mode that allows various clock signals to be brought out
on to the ECLK pin and N2HET1[12] device outputs. This mode is called the Clock Test mode. It is very
useful for debugging purposes and can be configured via the CLKTEST register in the system module.
Table 4-15. Clock Test Mode Options
SEL_ECP_PIN SEL_GIO_PIN
= SIGNAL ON ECLK = SIGNAL ON N2HET1[12]
CLKTEST[3-0] CLKTEST[11-8]
0000 Oscillator 0000 Oscillator Valid Status
0001 Main PLL free-running clock output 0001 Main PLL Valid status
0010 Reserved 0010 Reserved
0011 EXTCLKIN1 0011 Reserved
0100 LFLPO 0100 Reserved
0101 HFLPO 0101 HFLPO Valid status
0110 Secondary PLL free-running clock output 0110 Secondary PLL Valid Status
0111 EXTCLKIN2 0111 Reserved
1000 GCLK 1000 LFLPO
1001 RTI Base 1001 Oscillator Valid status
1010 Reserved 1010 Oscillator Valid status
1011 VCLKA1 1011 Oscillator Valid status
1100 Reserved 1100 Oscillator Valid status
1101 VCLKA3_DIVR 1101 VCLKA3_S
1110 VCLKA4_DIVR 1110 VCLKA4_S
1111 Reserved 1111 Oscillator Valid status
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