Datasheet
F28M36P63C, F28M36P53C, F28M36H53C, F28M36H53B, F28M36H33C, F28M36H33B
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SPRS825C –OCTOBER 2012–REVISED FEBRUARY 2014
2 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
This data sheet revision history highlights the technical changes made to the SPRS825B device-specific
data sheet to make it an SPRS825C revision.
Scope: F28M36x devices are now available in the Q temperature range (–40°C to 125°C, Q100 qualification for automotive
applications). See Table 3-1.
Added Section 8.3, Related Links, which provides quick access to available resources.
See the following table.
LOCATION ADDITIONS, DELETIONS, AND MODIFICATIONS
Global
• F28M36x devices are now available in the Q temperature range (–40°C to 125°C, Q100 qualification
for automotive applications). See Table 3-1.
• Changed description of 289-ball ZWT package from "Plastic Ball Grid Array (PBGA)" to "New Fine
Pitch Ball Grid Array (nFBGA)"
Section 1 Changed title from "F28M36x (Concerto) MCUs" to "Device Summary"
Section 1 Device Summary:
• Changed "Cortex™-M3 Core Hardware Logic Built-in Self Test" to "Cortex-M3 Core Hardware Built-in
Self-Test"
• Changed "C28x Core Hardware Logic Built-in Self Test" to "C28x Core Hardware Built-in Self-Test"
Section 1.3 Description:
• Added "Device Information" table
Table 3-1 Hardware Features:
• Updated "The maximum frequency at which the Cortex-M3 core can run ..." footnote
Table 3-2 Added "Possible Speed Combinations for Cortex-M3 and C28x Cores" table
Section 3.4.2 Changed title from "C28x™ Core Hardware Logic Built-In Test (LBIST)" to "C28x Core Hardware Built-In
Self-Test"
Section 3.4.2 C28x Core Hardware Built-In Self-Test:
• Changed "Logic Built-In Self Test (LBIST)" to "Hardware Built-In Self-Test (HWBIST)"
• Changed LBIST to HWBIST
Section 3.12.1 C28x Normal Mode:
• Removed reference to the HISPCP register
Figure 3-12 Updated "C28x Clocks and Low-Power Modes" figure
Table 4-1 Terminal Functions:
• XCLKOUT: Updated DESCRIPTION. Changed XCLKCFG to XPLLCLKCFG.
Section 5.2 Added "Handling Ratings" section
Table 6-4 Added "Crystal Equivalent Series Resistance (ESR) Requirements" table
Table 6-15 Power Management and Supervisory Circuit Solutions:
• Removed TPS75005
Table 6-22 Added "Master Subsystem – Flash Data Retention Duration" table
Table 6-30 Added "Control Subsystem – Flash Data Retention Duration" table
Table 7-37 Enhanced Quadrature Encoder Pulse (eQEP) Timing Requirements:
• Added footnote that references SPRZ375
Section 7.3.5 C28x Serial Communications Interface (SCI):
• Updated list of SCI module features:
– Changed "4-level transmit and receive FIFO" to "16-level transmit and receive FIFO"
Section 8 Device and Documentation Support:
• Added Section 8.3, Related Links
• Added "Trademarks" section
• Added "Electrostatic Discharge Caution" section
• Added "Glossary" section
Copyright © 2012–2014, Texas Instruments Incorporated Revision History 5
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Product Folder Links: F28M36P63C F28M36P53C F28M36H53C F28M36H53B F28M36H33C F28M36H33B