Datasheet

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ADC DYNAMIC PERFORMANCE
ADC CHANNEL CHARACTERISTICS
TLV320AIC12, TLV320AIC13
TLV320AIC14, TLV320AIC15
TLV320AIC12K, TLV320AIC14K
SLWS115E – OCTOBER 2001 – REVISED JANUARY 2007
Fs = 8 KHz
(1)
TEST
PARAMETER MIN TYP MAX MIN TYP MAX UNIT
CONDITIONS
AIC12/13/14/15 AIC12K/14K
V
I
= -1 dB 82 88 75 88
SNR Signal-to-noise ratio V
I
= -9 dB 78 82 82
V
I
= -40 dB 46
V
I
= -1 dB 84 90 75 90
THD Total harmonic distortion V
I
= -9 dB 82 88 88 dB
V
I
= -40 dB 67
V
I
= -1 dB 79 87 87
Signal-to-harmonic
THD+N V
I
= -9 dB 73 79 79
distortion + noise
V
I
= -40 dB 48
(1) The test condition is a differential 1020-Hz input signal with an 8-KHz conversion rate. Input and output common mode is 1.35 V.
TEST
PARAMETER MIN TYP MAX MIN TYP MAX UNIT
CONDITIONS
AIC12/13/14/15 AIC12K/14K
Preamplifier gain = 6
V
I(pp)
Single-ended input level 2 2 V
dB
V
IO
Input offset voltage MICIN, INPx, INMx ± 10 ± 10 mV
I
B
Input bias current MICIN, INPx, INMx 34 34 µA
Common-mode voltage 1.35 1.35 V
Dynamic range V
I
= -1 dB 85 85 dB
Mute attenuation PGA = MUTE 80 80 dB
Intrachannel isolation 87 87 dB
E
G
Gain error V
I
= -1 dB at 1020 Hz 0.6 0.6 dB
E
O(ADC)
ADC converter offset error ± 10 ± 10 mV
Common-mode rejection
CMRR V
I
= -1 dB at 1020 Hz 50 50 dB
ratio at INMx and INPx
Idle channel noise V
(INP,INM,MICIN)
= 0 V 50 100 50 µVrms
R
I
Input resistance T
A
= 25 ° C 30 30 k Ω
C
I
Input capacitance T
A
= 25 ° C 2 2 pF
IIR 5/f
s
5/f
s
S
Channel delay
FIR 17/f
s
17/f
s
S
8
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