Datasheet
4–3
4.3.4 ADC Channel Characteristics
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
I(PP)
Peak-to-peak input voltage (differential) Preamp gain = 0 dB 4 V
Dynamic range V
I
= –3 dB 82 dB
Intrachannel isolation 87 dB
E
G
Gain error V
I
= –1 dB at 1020 Hz 0.6 dB
E
O(ADC)
ADC converter offset error ±15 mV
CMRR Common-mode rejection ratio at INM, INP or AUXM, AUXP V
I
= –1 dB at 1020 Hz 80 dB
Idle channel noise (on-chip reference) V
INP,INM
= 0 V 25 70 µVrms
R
j
Input resistance T
A
= 25°C 35 kΩ
Channel delay 17/f
s
s
4.3.5 DAC Path Filter, Fs = 8 kHz (see Note 4)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
0 Hz to 300 Hz –0.5 0.2
300 Hz to 3 kHz –0.65 0.25
Filter gain relative to gain at 1020 Hz
3.3 kHz –0.75 0.3
dB
Filter gain relative to gain at 1020 Hz
3.6 kHz –3
dB
4 kHz –35
≥ 4.4 kHz –74
NOTE 4: The filter gain outside of the passband is measured with respect to the gain at 1020 Hz. The input signal is the digital equivalent of a
sine wave (digital full scale = 0 dB). The nominal differential DAC channel output with this input condition is 6 V
I(PP)
. The pass band
is 0 to 3600 Hz for an 8-kHz sample rate. This pass band scales linearly with the conversion rate.
4.3.6 DAC Dynamic Performance
4.3.6.1 DAC Signal-to-Noise When Load is 600 Ω (see Note 5)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
I
= 0 dB 80 85
SNR
Signal to noise ratio
V
I
= –3 dB 78 84
dB
SNR Signal-to-noise ratio
V
I
= –9 dB
72 78
dB
V
I
= –40 dB 35 42
NOTE 5: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test is measured at output of
application schematic low-pass filter. The test is conducted in 16-bit mode.
4.3.6.2 DAC Signal-to-Distortion when load is 600 Ω (see Note 5)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
V
I
= 0 dB 70 77
THD
Signal to total harmonic distortion
V
I
= –3 dB 78 85
dB
THD Signal-to-total harmonic distortion
V
I
= –9 dB
78 85
dB
V
I
= –40 dB 62 66
NOTE 5: The test condition is the digital equivalent of a 1020-Hz input signal with an 8-kHz conversion rate. The test is measured at output of
application schematic low-pass filter. The test is conducted in 16-bit mode.