Datasheet

TLV2352, TLV2352Y
LinCMOS DUAL LOW-VOLTAGE DIFFERENTIAL COMPARATORS
SLCS011B – MAY 1992 – REVISED MARCH 1999
13
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
Propagation delay time is defined as the interval between the application of an input step function and the instant when
the output crosses V
O
= 1 V with V
DD
= 3 V or when the output crosses V
O
= 1.4 V with V
DD
= 5 V. Propagation delay
time, low-to-high-level output, is measured from the leading edge of the input pulse while propagation delay time,
high-to-low-level output, is measured from the trailing edge of the input pulse. Propagation-delay-time measurement
at low input signal levels can be greatly affected by the input offset voltage. The offset voltage should be balanced
by the adjustment at the inverting input (as shown in Figure 11) so that the circuit is just at the transition point. Then
a low signal, for example 105-mV or 5-mV overdrive, causes the output to change states.
+
–
DUT
V
DD
C
L
(see Note A)
Pulse
Generator
10 Ω
10 Turn
1 V
– 1 V
1 kΩ
50 Ω
1 µF
0.1 µF
TEST CIRCUIT
100 mV
Input
Overdrive
t
PLH
100 mVInput
Overdrive
90%
10%
t
f
t
PHL
Low-to-High
Level Output
High-to-Low
Level Output
VOLTAGE WAVEFORMS
5.1 kΩ
Input Offset Voltage
Compensation
Adjustment
90%
10%
t
r
V
O
= 1 V With V
DD
= 3 V
or
V
O
= 1.4 V With V
DD
= 5 V
NOTE A: C
L
includes probe and jig capacitance.
Figure 11. Propagation Delay, Rise, and Fall Times Test Circuit and Voltage Waveforms