Datasheet

TLV2332, TLV2332Y, TLV2334, TLV2334Y
LinCMOS LOW-VOLTAGE MEDIUM-POWER
OPERATIONAL AMPLIFIERS
SLOS189 – FEBRUARY 1997
22
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
single-supply versus split-supply test circuits
Because the TLV233x is optimized for single-supply operation, circuit configurations used for the various tests
often present some inconvenience since the input signal, in many cases, must be offset from ground. This
inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative
rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives
the same result.
+
+
V
DD
V
O
R
L
C
L
V
I
R
L
C
L
V
O
V
DD+
V
I
V
DD
(a) SINGLE SUPPLY (b) SPLIT SUPPLY
Figure 34. Unity-Gain Amplifier
+
+
V
DD
V
DD+
V
DD
V
O
V
O
(a) SINGLE SUPPLY (b) SPLIT SUPPLY
20
20
20
20
1/2 V
DD
2 k
2 k
Figure 35. Noise-Test Circuit
+
+
10 k
1/2 V
DD
100
V
O
V
DD
V
I
V
I
100
(a) SINGLE SUPPLY (b) SPLIT SUPPLY
10 k
V
DD+
V
DD
C
L
C
L
V
O
Figure 36. Gain-of-100 Inverting Amplifier