Datasheet
TLV2322, TLV2322Y, TLV2324, TLV2324Y
LinCMOS LOW-VOLTAGE LOW-POWER
OPERATIONAL AMPLIFIERS
SLOS187 – FEBRUARY 1997
22
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
single-supply versus split-supply test circuits
Because the TLV232x is optimized for single-supply operation, circuit configurations used for the various tests
often present some inconvenience since the input signal, in many cases, must be offset from ground. This
inconvenience can be avoided by testing the device with split supplies and the output load tied to the negative
rail. A comparison of single-supply versus split-supply test circuits is shown below. The use of either circuit gives
the same result.
–
+
–
+
V
DD
V
I
C
L
R
L
V
O
V
DD+
V
DD–
V
I
V
O
C
L
R
L
(a) SINGLE SUPPLY
(b) SPLIT SUPPLY
Figure 35. Unity-Gain Amplifier
–
+
–
+
1/2 V
DD
V
DD
20 Ω
20 Ω
2 kΩ
2 kΩ
V
DD+
V
DD–
V
O
V
O
20 Ω
20 Ω
(a) SINGLE SUPPLY
(b) SPLIT SUPPLY
Figure 36. Noise-Test Circuits
–
+
–
+
10 kΩ
1/2 V
DD
100 Ω
V
O
V
DD
V
I
V
I
100 Ω
(a) SINGLE SUPPLY (b) SPLIT SUPPLY
10 kΩ
V
DD+
V
DD–
C
L
C
L
V
O
Figure 37. Gain-of-100 Inverting Amplifier