Datasheet

 
      
    
SLAS251A − DECEMBER 1999 − REVISED JANUARY 2003
26
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
CS
CSTART
EOC
INT
V
OH
V
OL
V
IH
V
IL
V
OH
V
OL
V
IH
V
IL
t
d(CSH-CSTARTL)
t
wL(CSTART)
t
(conv)
t
d(CSTARTH-EOCL)
t
d(CSL-INTH)
t
d(CSTARTH-INTL)
SELECT CYCLE
CSTART
falling edge may come before the rising edge of CS but no sooner than the fifth SCLK of the SELECT CYCLE.
Figure 17. Critical Timing (Extended Sampling, Single Shot)
V
IH
V
IL
V
OH
V
OL
V
OH
V
OL
V
IH
V
IL
CS
CSTART
EOC
INT
t
d(CSH-CSTARTL)
t
wL(CSTART)
t
d(CSTARTH−CSTARTL)
t
d(CSTARTH-EOCL)
t
d(CSTARTH-INTL)
t
d(CSL-INTH)
SELECT CYCLE
CSTART falling edge may come before the rising edge of CS
but no sooner than the fifth SCLK of the SELECT CYCLE. In this case,
the actual sampling time is measured from the rising edge CS
to the rising edge of CSTART.
Figure 18. Critical Timing (Extended Sampling, Repeat/Sweep/Repeat Sweep)