Datasheet

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      
    
SLAS251A − DECEMBER 1999 − REVISED JANUARY 2003
24
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
operating characteristics over recommended operating free-air temperature range, V
CC
= V
REFP
= 2.7 V to
5.5 V, V
REFM
= 0 V, SCLK frequency = 20 MHz at 5 V, 15 MHz at 3 V (unless otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP
†
MAX UNIT
E
L
Integral linearity error (INL) (see Note 6) ±0.5 LSB
E
D
Differential linearity error (DNL) See Note 5 ±0.5 LSB
E
O
Offset error (see Note 7) See Note 5 ±1 LSB
E
FS
Full scale error (see Note 7) See Note 5 ±1 LSB
SDI = B000h
200h
(512D)
Self-test output code (see Table 1 and Note 8)
SDI = C000h
000h (0D)
Self-test output code (see Table 1 and Note 8)
SDI = D000h
3FFh
(1023D)
Internal OSC 2.33 3.5 3.86
t
(conv)
Conversion time
External SCLK
(14 DIV)
f
SCLK
µs
t
(sample)
Sampling time
With a maximum of 1-kΩ input
source impedance
600 ns
†
All typical values are at T
A
= 25°C.
NOTES: 5. Analog input voltages greater than that applied to REFP convert as all ones (1111111111), while input voltages less than that applied
to REFM convert as all zeros (0000000000).
6. Linear error is the maximum deviation from the best straight line through the A/D transfer characteristics.
7. Zero error is the difference between 0000000000 and the converted output for zero input voltage: full-scale error is the difference
between 1111111111 and the converted output for full-scale input voltage.
8. Both the input data and the output codes are expressed in positive logic.