Datasheet

 
  
  

SLOS098D − AUGUST 1991 − REVISED MAY 1998
13
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
†
Figure 1
DISTRIBUTION
OF
OUTPUT VOLTAGE
2
1
0.5
0
3
1.5
2.48 2.49 2.5 2.51 2.52
Percentage of Units − %
2.5
V
O
− Output Voltage − V
98 Units Tested
From 2 Wafer Lots
V
I
= 5 V
T
A
= 25°C
Figure 2
6.05 6.075
V
O
− Output Voltage − V
20
10
0
40
30
6 6.025 6.1
Percentage of Units − %
DISTRIBUTION
OF
OUTPUT VOLTAGE
V
I
= 12 V
T
A
= 25°C
98 Units Tested
From 2 Wafer Lots
Figure 3
VO − Output Voltage Change − mV
0
02550
75
OUTPUT VOLTAGE CHANGE
vs
FREE-AIR TEMPERATURE
150
75 100 125
∆V
O
T
A
− Free-Air Temperature − °C
V
I
= 40 V I
O
= 0
V
I
= 12 V
V
I
= 4 V, 5 V
−75
−150
−75
−50 −25
Figure 4
2
1
0
−1
048121620
Output Voltage Error − %
3
OUTPUT VOLTAGE ERROR
vs
INPUT VOLTAGE
4
24 36 40
V
I
− Input Voltage − V
28 32
I
O
= 0
T
A
= 25°C
Error Equals V
O
/V
I
Deviation From 50%
†
Data at high and low temperatures are applicable within the rated operating free-air temperature ranges of the various devices.