Datasheet

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  
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SLOS065D − MARCH 1991 − REVISED APRIL 2002
7
WWW.TI.COM
POST OFFICE BOX 1443
• HOUSTON, TEXAS 77251−1443
TYPICAL CHARACTERISTICS
†
2.48
2.49
2.5
2.51
2.52
2.47
2.53
25 50 75 100
125
0
−25−50−75
OUTPUT VOLTAGE
vs
FREE-AIR TEMPERATURE
24
12
0
2.48 2.49
2.5 2.51 2.52
DISTRIBUTION OF
OUTPUT VOLTAGE
Percentage of Units − %
V
O
− Output Voltage − V
V) − Output Voltage − V
V
O
T
A
− Free-Air Temperature − °C
20
16
8
4
V
I
= 5 V
T
A
= 25°C
100 Units Tested
From 1 Wafer Lot
V
I
= 5 V
I
O
= 0
Figure 1 Figure 2
200
50
0
250
150
100
5
0
10 15 20
25
30 35 40
INPUT BIAS CURRENT
vs
INPUT VOLTAGE
OUTPUT VOLTAGE HYSTERESIS
vs
FREE-AIR TEMPERATURE
2
4
0
−2
−4
−6
−10
−8
25
50 75 100
125
0
−25−50−75
T
A
− Free-Air Temperature − °C
Output Voltage Hysteresis − mV
V
I
− Input Voltage − V
End Point
Start Point
Normalized to First 25°C V
O
V
I
= 5 V
I
O
= 0
T
A
= 25°C
IIB − Input Bias Current −
I
IB
Aµ
Figure 3 Figure 4
†
Data at high and low temperatures are applicable within rated operating free-air temperature ranges of the various devices.