Datasheet

−400
12
8
4
0
0
Percentage of Units − %
16
20
24
400 800
TLE2141
DISTRIBUTION OF
INPUT OFFSET VOLTAGE
V
IO
− Input Offset Voltage − µV
236 Units Tested From 1 Wafer Lot
V
CC
±
= ±15 V
T
A
= 25°C
P Package
−800
10
8
4
2
0
18
6
IIO − Input Offset Current − nA
14
12
16
20
I
IO
INPUT OFFSET CURRENT
vs
FREE-AIR TEMPERATURE
−75 −50 −25 0 25 50 75 100 125
T
A
− Free-Air Temperature − °C
150
V
CC
±
= ±15 V
V
CC
±
= ±2.5 V
V
O
= 0
V
IC
= 0
−2−2.5
−0.2
−1
−1.2
−1.4
−1.5 −1
IIB − Input Bias Current − uA
0
0 0.5 1
INPUT BIAS CURRENT
vs
COMMON-MODE INPUT VOLTAGE
µAI
IB
V
IC
− Common-Mode Input Voltage − V
V
CC
±
= ±2.5 V
T
A
= 25°C
T
A
= 125°C
T
A
= −55°C
−0.4
−0.6
−0.8
−3 −0.5
IIB − Input Bias Current − nA
−1000
I
IB
INPUT BIAS CURRENT
vs
FREE-AIR TEMPERATURE
T
A
− Free-Air Temperature − °C
−75 −50 −25 0 25 50 75 100 125 150
V
O
= 0
V
IC
= 0
V
CC
±
= ±15 V
−900
−800
−700
−600
−500
V
CC
±
= ±2.5 V
TLE2141-Q1
SLOS525 –SEPTEMBER 2011 www.ti.com
Figure 2. Figure 3.
Figure 4. Figure 5.
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