Datasheet

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ABSOLUTE MAXIMUM RATINGS
RECOMMENDED OPERATING CONDITIONS
ELECTRICAL CHARACTERISTICS
TLC5615C , TLC5615I
SLAS142E – OCTOBER 1996 – REVISED JUNE 2007
over operating free-air temperature range (unless otherwise noted)
(1)
UNIT
Supply voltage (V
DD
to AGND) 7V
Digital input voltage range to AGND –0.3V to V
DD
+ 0.3V
Reference input voltage range to AGND –0.3V to V
DD
+ 0.3V
Output voltage at OUT from external source V
DD
+ 0.3V
Continuous current at any terminal ± 20mA
Operating free-air temperature range, T
A
TLC5615C 0 ° C to +70 ° C
TLC5615I –40 ° C to +85 ° C
Storage temperature range, T
stg
–65 ° C to +150 ° C
Lead temperature 1,6mm (1/16 inch) from case for 10 seconds +260 ° C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
MIN NOM MAX UNIT
Supply voltage, V
DD
4.5 5 5.5 V
High-level digital input voltage, V
IH
2.4 V
Low-level digital input voltage, V
IL
0.8 V
Reference voltage, V
ref
to REFIN terminal 2 2.048 V
DD
–2 V
Load resistance, R
L
2 k Ω
TLC5615C 0 70 ° C
Operating free-air temperature, T
A
TLC5615I 40 85 ° C
over recommended operating free-air temperature range, V
DD
= 5V ± 5%, V
ref
= 2.048V (unless otherwise noted)
STATIC DAC SPECIFICATIONS
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Resolution 10 bits
Integral nonlinearity, end point adjusted (INL) V
ref
= 2.048V, See
(1)
± 1 LSB
Differential nonlinearity (DNL) V
ref
= 2.048V, See
(2)
± 0.1 ± 0.5 LSB
E
ZS
Zero-scale error (offset error at zero scale) V
ref
= 2.048V, See
(3)
± 3 LSB
Zero-scale-error temperature coefficient V
ref
= 2.048V, See
(4)
3 ppm/ ° C
E
G
Gain error V
ref
= 2.048V, See
(5)
± 3 LSB
Gain-error temperature coefficient V
ref
= 2.048V, See
(6)
1 ppm/ ° C
Zero scale 80
PSRR Power-supply rejection ratio See
(7) (8)
dB
Gain 80
Analog full scale output R
L
= 100k Ω 2V
ref
(1023/1024) V
(1) The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output from
the line between zero and full scale excluding the effects of zero code and full-scale errors (see text). Tested from code 3 to code 1024.
(2) The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal 1LSB
amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains constant)
as a change in the digital input code. Tested from code 3 to code 1024.
(3) Zero-scale error is the deviation from zero-voltage output when the digital input code is zero (see text).
(4) Zero-scale-error temperature coefficient is given by: E
ZS
TC = [E
ZS
(T
max
) – E
ZS
(T
min
)]/V
ref
× 10
6
/(T
max
– T
min
).
(5) Gain error is the deviation from the ideal output (V
ref
– 1LSB) with an output load of 10k Ω excluding the effects of the zero-scale error.
(6) Gain temperature coefficient is given by: E
G
TC = [E
G
(T
max
) – E
G
(T
min
)]/V
ref
× 10
6
/(T
max
– T
min
).
(7) Zero-scale-error rejection ratio (EZS-RR) is measured by varying the V
DD
from 4.5V to 5.5V dc and measuring the proportion of this
signal imposed on the zero-code output voltage.
(8) Gain-error rejection ratio (EG-RR) is measured by varying the V
DD
from 4.5V to 5.5V dc and measuring the proportion of this signal
imposed on the full-scale output voltage after subtracting the zero-scale change.
3
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