Datasheet

   
    
SLOS051E − OCTOBER 1987 − REVISED AUGUST 2008
18
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TYPICAL CHARACTERISTICS
Figure 6
−5
Percentage of Units − %
V
IO
− Input Offset Voltage − mV
60
5
0
−4 −3 −2 −1 0 1 2 3 4
10
20
30
40
50
DISTRIBUTION OF TLC27M2
INPUT OFFSET VOLTAGE
612 Amplifiers Tested From 4 Wafer Lots
V
DD
= 5 V
T
A
= 25°C
P Package
Figure 7
50
40
30
20
10
43210−1−2−3−4
0
5
60
V
IO
− Input Offset Voltage − mV
Percentage of Units − %
−5
DISTRIBUTION OF TLC27M2
INPUT OFFSET VOLTAGE
P Package
T
A
= 25°C
612 Amplifiers Tested From 4 Wafer Lots
V
DD
= 10 V
Figure 8
−10
Percentage of Units − %
α
VIO
− Temperature Coefficient − µV/°C
60
10
0
−8 −6 −4 −2 0 2 4 6 8
10
20
30
40
50
DISTRIBUTION OF TLC27M2 AND TLC27M7
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
Outliers:
(1) 33.0 µV/°C
T
A
= 25°C to 125°C
P Package
224 Amplifiers Tested From 6 Wafer Lots
V
DD
= 5 V
Figure 9
50
40
30
20
10
86420−2−4−6−8
0
10
60
α
VIO
− Temperature Coefficient − µV/°C
Percentage of Units − %
−10
DISTRIBUTION OF TLC27M2 AND TLC27M7
INPUT OFFSET VOLTAGE
TEMPERATURE COEFFICIENT
Outliers:
(1) 34.6 µV/°C
224 Amplifiers Tested From 6 Wafer Lots
V
DD
= 10 V
T
A
= 25°C to 125°C
P Package