Datasheet

   
      
    ± 
SLAS262C − OCTOBER 2000 − REVISED MAY 2003
10
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TLC3574I N package device AC/DC performance (continued)
PARAMETER TEST CONDITIONS MIN TYP
†
MAX UNIT
AC Accuracy—Normal Short Sampling
SINAD
Signal-to-noise ratio + distortion
f
i
= 20 kHz 76
dB
SINAD
Signal-to-noise ratio + distortion
f
i
= 100 kHz 70
dB
THD
Total harmonic distortion
f
i
= 20 kHz −81
dB
THD
Total harmonic distortion
f
i
= 100 kHz −74
dB
SNR
Signal-to-noise ratio
f
i
= 20 kHz 78
dB
SNR
Signal-to-noise ratio
f
i
= 100 kHz 75
dB
ENOB
Effective number of bits
f
i
= 20 kHz 12.3
Bits
ENOB
Effective number of bits
f
i
= 100 kHz 11.3
Bits
SFDR
Spurious free dynamic range
f
i
= 20 kHz 83
dB
SFDR
Spurious free dynamic range
f
i
= 100 kHz 75
dB
Channel-to-channel isolation
Fixed channel in conversion mode 00, f
i
= 35 kHz,
See Notes 2 and 5
81 dB
Analog input bandwidth
Full power bandwidth, −3 dB 1 MHz
Analog input bandwidth
Full power bandwidth, −1 dB 700 kHz
†
All typical values are at T
A
= 25°C.
NOTES: 2. This is for a fixed channel in conversion mode 00 or 01. When switching the channels, additional multiplexer setting time is required
to overcome the memory effect of the charge redistribution DAC.
5. It is measured by applying a full-scale of 35 kHz signal to other channels and determining how much the signal is attenuated in the
channel of interest. The converter samples this examined channel continuously. The channel-to-channel isolation is degraded if the
converter samples different channels alternately.