Datasheet

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  

SLVS017R − SEPTEMBER 1987 − REVISED AUGUST 2003
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
electrical characteristics, V
I
= 14 V, I
O
= 10 mA, T
J
= 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
†
TL750L05
TL751L05
UNIT
PARAMETER
TEST CONDITIONS
†
MIN TYP MAX
UNIT
Output voltage
V
I
= 6 V to 26 V,
I
O
= 0 to 150 mA
T
J
= 25°C 4.80 5 5.2
V
Output voltage V
I
= 6 V to 26 V, I
O
= 0 to 150 mA
T
J
= 0°C to 125°C
4.75 5.25
V
Input regulation voltage
V
I
= 9 V to 16 V 5 10
mV
Input regulation voltage
V
I
= 6 V to 26 V 6 30
mV
Ripple rejection V
I
= 8 V to 18 V, f = 120 Hz 60 65 dB
Output regulation voltage I
O
= 5 mA to 150 mA 20 50 mV
Dropout voltage
I
O
= 10 mA 0.2
V
Dropout voltage
I
O
= 150 mA 0.6
V
Output noise voltage f = 10 Hz to 100 kHz 500 µV
I
O
= 150 mA 10 12
Input bias current
V
I
= 6 V to 26 V, I
O
= 10 mA, T
J
= 0°C to 125°C 1 2
mA
Input bias current
ENABLE > 2 V
0.5
mA
†
Pulse-testing techniques are used to maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must
be taken into account separately. All characteristics are measured with a 0.1-µF capacitor across the input and a 10-µF capacitor, with equivalent
series resistance of less than 0.4 Ω, across the output.
electrical characteristics, V
I
= 14 V, I
O
= 10 mA, T
J
= 25°C (unless otherwise noted)
PARAMETER
TEST CONDITIONS
†
TL750L08
TL751L08
UNIT
PARAMETER
TEST CONDITIONS
†
MIN TYP MAX
UNIT
Output voltage
V
I
= 9 V to 26 V,
I
O
= 0 to 150 mA
T
J
= 25°C 7.68 8 8.32
V
Output voltage V
I
= 9 V to 26 V, I
O
= 0 to 150 mA
T
J
= 0°C to 125°C
7.6 8.4
V
Input regulation voltage
V
I
= 10 V to 17 V 10 20
mV
Input regulation voltage
V
I
= 9 V to 26 V 25 50
mV
Ripple rejection V
I
= 11 V to 21 V, f = 120 Hz 60 65 dB
Output regulation voltage I
O
= 5 mA to 150 mA 40 80 mV
Dropout voltage
I
O
= 10 mA 0.2
V
Dropout voltage
I
O
= 150 mA 0.6
V
Output noise voltage f = 10 Hz to 100 kHz 500 µV
I
O
= 150 mA 10 12
Input bias current
V
I
= 9 V to 26 V, I
O
= 10 mA, T
J
= 0°C to 125°C 1 2
mA
Input bias current
ENABLE > 2 V
0.5
mA
†
Pulse-testing techniques are used to maintain the junction temperature as close to the ambient temperature as possible. Thermal effects must
be taken into account separately. All characteristics are measured with a 0.1-µF capacitor across the input and a 10-µF capacitor, with equivalent
series resistance of less than 0.4 Ω, across the output.