Datasheet

TL16C752B-EP
SGLS153B FEBRUARY 2003REVISED DECEMBER 2007
www.ti.com
TIMING REQUIREMENTS
T
A
= –55°C to 110°C (L device) , –40°C to 105°C (T device) V
CC
= 3.3 V + 10% (unless otherwise noted) (see Figures 12
through Figure 19)
PARAMETER TEST CONDITIONS MIN MAX UNIT
t
d1
IOR delay from chip select 0 ns
t
d2
Read cycle delay 2t
p(I)
(1)
ns
t
d3
Delay from IOR to data 28.5 ns
t
d4
Data disable time 15 ns
t
d5
IOW delay from chip select 10 ns
t
d6
Write cycle delay 100-pF load 2t
p(I)
(1)
ns
t
d7
Delay from IOW to output 100-pF load 50 ns
t
d8
Delay to set interrupt from MODEM input 100-pF load 70 ns
t
d9
Delay to reset interrupt from IOR 70 ns
t
d10
Delay from stop to set interrupt 100-pF load 1
Rclk
(2)
t
d11
Delay from IOR to reset interrupt 70 ns
t
d12
Delay from stop to interrupt 100 ns
t
d13
Delay from initial INT reset to transmit start 8 24
(2)
t
d14
Delay from IOW to reset interrupt 70 ns
t
d15
Delay from stop to set RXRDY 1 Clock
t
d16
Delay from IOR to reset RXRDY 1 μm
t
d17
Delay from IOW to set TXRDY 70 ns
t
d18
Delay from start to reset TXRDY 16
(2)
t
d19
Delay between successive assertion of IOW and IOR 4P
(1) (2)
t
h1
Chip select hold time from IOR 0 ns
t
h2
Chip select hold time from IOW 0 ns
t
h3
Data hold time 15 ns
th4 Address hold time 0 ns
t
h5
Hold time from XTAL1 clock to IOW or IOR release 20 ns
t
p1
, t
p2
Clock cycle period 20 ns
t
p3
Oscillator/clock speed V
CC
= 3 V 48 MHz
t
(RESET)
Reset pulse width 200 ns
t
su1
Address setup time 0 ns
t
su2
Data setup time 16 ns
t
su3
Setup time from IOW or IOR assertion to XTAL1 clock 20 ns
t
w1
IOR strobe width 2t
p(I)
(1)
ns
t
w2
IOW strobe width 2t
p(I)
(1)
ns
(1) t
p(I)
= input clock period
(2) Baud rate
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