Datasheet
14 15
RESET
DTRB
DTRA
RTSA
OPA
RXRDYA
INTA
INTB
A0
A1
A2
NC
36
35
34
33
32
31
30
29
28
27
26
25
16
1
2
3
4
5
6
7
8
9
10
11
12
D5
D6
D7
RXB
RXA
TXRDYB
TXA
TXB
OPB
CSA
CSB
NC
17 18 19 20
RIA
CDA
DSRA
CTSA
47 46 45 44 4348 42
D4
D3
D2
D1
D0
RTSB
CTSB
NC
IOW
GND
RXRDYB
IOR
DSRB
RIB
40 39 3841
21 22 23 24
37
13
NC
TXRDYA
XTAL2
XTAL1
CDB
PACKAGE
(TOP VIEW)
V
CC
NC − No internal connection
TL16C752B-EP
www.ti.com
SGLS153B –FEBRUARY 2003–REVISED DECEMBER 2007
3.3 V DUAL UART WITH 64-BYTE FIFO
Check for Samples: TL16C752B-EP
1
FEATURES
• Controlled Baseline • Fast Access Time 2 Clock Cycle IOR/IOW
Pulse Width
– One Assembly Site
• Programmable Sleep Mode
– Test Site
• Programmable Serial Interface Characteristics
– One Fabrication Site
– 5-Bit, 6-Bit, 7-Bit, or 8-Bit Characters
• Extended Temperature Performance of
–55°C to 110°C and –40°C to 105°C – Even, Odd, or No Parity Bit Generation and
Detection
• Enhanced Diminishing Manufacturing Sources
(DMS) Support – 1, 1.5, or 2 Stop Bit Generation
• Enhanced Product Change Notification • False Start Bit Detection
• Qualification Pedigree
(1)
• Complete Status Reporting Capabilities in
Both Normal and Sleep Mode
• Pin Compatible With ST16C2550 With
Additional Enhancements • Line Break Generation and Detection
• Up to 1.5-Mbps Baud Rate When Using Crystal • Internal Test and Loopback Capabilities
(24-MHz Input Clock)
• Fully Prioritized Interrupt System Controls
• Up to 3-Mbps Baud Rate When Using
• Modem Control Functions (CTS, RTS, DSR,
Oscillator or Clock Source (48-MHz Input
DTR, RI, and CD)
Clock)
• 64-Byte Transmit FIFO
• 64-Byte Receive FIFO With Error Flags
• Programmable and Selectable Transmit and
Receive FIFO Trigger Levels for DMA and
Interrupt Generation
• Programmable Receive FIFO Trigger Levels for
Software/Hardware Flow Control
• Software/Hardware Flow Control
– Programmable Xon/Xoff Characters
– Programmable Auto-RTS and Auto-CTS
• Optional Data Flow Resume by Xon Any
Character
• DMA Signaling Capability for Both Received
and Transmitted Data
• Supports 3.3-V Operation
• Software Selectable Baud Rate Generator
• Prescaler Provides Additional Divide By Four
Function
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.