Datasheet

14 15
RESET
DTRB
DTRA
RTSA
OPA
RXRDYA
INTA
INTB
A0
A1
A2
NC
36
35
34
33
32
31
30
29
28
27
26
25
16
1
2
3
4
5
6
7
8
9
10
11
12
D5
D6
D7
RXB
RXA
TXRDYB
TXA
TXB
OPB
CSA
CSB
NC
17 18 19 20
RIA
CDA
DSRA
CTSA
47 46 45 44 4348 42
D4
D3
D2
D1
D0
RTSB
CTSB
NC
IOW
GND
RXRDYB
IOR
DSRB
RIB
40 39 3841
21 22 23 24
37
13
NC
TXRDYA
XTAL2
XTAL1
CDB
PACKAGE
(TOP VIEW)
V
CC
NC − No internal connection
TL16C752B-EP
www.ti.com
SGLS153B FEBRUARY 2003REVISED DECEMBER 2007
3.3 V DUAL UART WITH 64-BYTE FIFO
Check for Samples: TL16C752B-EP
1
FEATURES
Controlled Baseline Fast Access Time 2 Clock Cycle IOR/IOW
Pulse Width
One Assembly Site
Programmable Sleep Mode
Test Site
Programmable Serial Interface Characteristics
One Fabrication Site
5-Bit, 6-Bit, 7-Bit, or 8-Bit Characters
Extended Temperature Performance of
–55°C to 110°C and –40°C to 105°C Even, Odd, or No Parity Bit Generation and
Detection
Enhanced Diminishing Manufacturing Sources
(DMS) Support 1, 1.5, or 2 Stop Bit Generation
Enhanced Product Change Notification False Start Bit Detection
Qualification Pedigree
(1)
Complete Status Reporting Capabilities in
Both Normal and Sleep Mode
Pin Compatible With ST16C2550 With
Additional Enhancements Line Break Generation and Detection
Up to 1.5-Mbps Baud Rate When Using Crystal Internal Test and Loopback Capabilities
(24-MHz Input Clock)
Fully Prioritized Interrupt System Controls
Up to 3-Mbps Baud Rate When Using
Modem Control Functions (CTS, RTS, DSR,
Oscillator or Clock Source (48-MHz Input
DTR, RI, and CD)
Clock)
64-Byte Transmit FIFO
64-Byte Receive FIFO With Error Flags
Programmable and Selectable Transmit and
Receive FIFO Trigger Levels for DMA and
Interrupt Generation
Programmable Receive FIFO Trigger Levels for
Software/Hardware Flow Control
Software/Hardware Flow Control
Programmable Xon/Xoff Characters
Programmable Auto-RTS and Auto-CTS
Optional Data Flow Resume by Xon Any
Character
DMA Signaling Capability for Both Received
and Transmitted Data
Supports 3.3-V Operation
Software Selectable Baud Rate Generator
Prescaler Provides Additional Divide By Four
Function
(1) Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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