Datasheet

THS770012
www.ti.com
SLOS669C FEBRUARY 2010REVISED JANUARY 2012
ELECTRICAL CHARACTERISTICS (continued)
Test conditions are at T
A
= +25°C, V
S+
= +5V, V
OCM
= +2.5V, V
OUT
= 2V
PP
, R
L
= 400 differential, G = +12dB, differential input
and output, and input and output referenced to midsupply, unless otherwise noted. Measured using evaluation module as
discussed in Test Circuits section.
TEST
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
LEVEL
(1)
OUTPUT COMMON-MODE VOLTAGE CONTROL
V
OCM
small-signal bandwidth V
OUT_CM
= 200mV
PP
300 MHz C
V
OCM
slew rate V
OUT_CM
= 500mV step 150 V/µs C
V
OCM
voltage range Supplied by external source
(2)
2.25 2.5 2.75 V C
V
OCM
gain V
OCM
= 2.5V 0.98 1 1.02 V/V A
Output common-mode offset
V
OCM
= 2.5V 30 ±12 30 mV A
from V
OCM
input
V
OCM
input bias current 2.25V V
OCM
2.75V 400 ±30 400 µA A
POWER SUPPLY
Specified operating voltage 4.75 5 5.25 V C
T
A
= +25°C 85 100 115 mA A
Quiescent current
T
A
= 40°C to +85°C 80 125 mA B
T
A
= +25°C, V
S+
= 5V ±0.25V 60 90 dB A
Power-supply rejection ratio
T
A
= 40°C to +85°C, V
S+
= 5V ±0.5V 59 dB B
POWER-DOWN
Enable voltage threshold Device powers on below 0.5V 0.5 V A
Disable voltage threshold Device powers down above 2.0V 2 V A
Power-down quiescent current 0.8 3 mA A
Input bias current 80 100 µA A
Turn-on time delay Time to V
OUT
= 90% of final value 10 µs C
Turn-off time delay Time to V
OUT
= 10% of original value 0.15 µs C
THERMAL CHARACTERISTICS
Specified operating range 40 +85 °C C
Thermal resistance, θ
JC
(3)
Junction to case (bottom) 8.9 °C/W C
Thermal resistance, θ
JA
(3)
Junction to ambient 44.1 °C/W C
(2) Limits set by best harmonic distortion with V
OUT
= 3V
PP
. V
OCM
voltage range can be extended if lower output swing is used or distortion
degradation is allowed, and increased bias current into pin is acceptable. For more information, see Figure 18 and Figure 34.
(3) Tested using JEDEC High-K test PCB. Thermal management of the final printed circuit board (PCB) should keep the junction
temperature below +125°C for long term reliability.
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