Datasheet

THS4509
SLOS454H JANUARY 2005REVISED NOVEMBER 2009
www.ti.com
ELECTRICAL CHARACTERISTICS: V
S+
– V
S–
= 3 V
Test conditions at V
S+
= +1.5 V, V
S–
= –1.5 V, G = 10 dB, CM = open, V
O
= 1 V
PP
, R
F
= 349 , R
L
= 200- differential,
T
A
= +25°C, single-ended input, differential output, and input and output referenced to midsupply, unless otherwise noted.
THS4509
TEST
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT LEVEL
(1)
AC PERFORMANCE
G = 6 dB, V
O
= 100 mV
PP
1.9 GHz
G = 10 dB, V
O
= 100 mV
PP
1.6 GHz
Small-signal bandwidth
G = 14 dB, V
O
= 100 mV
PP
625 MHz
G = 20 dB, V
O
= 100 mV
PP
260 MHz
Gain-bandwidth product G = 20 dB 3 GHz
Bandwidth for 0.1-dB flatness G = 10 dB, V
O
= 1 V
PP
400 MHz
Large-signal bandwidth G = 10 dB, V
O
= 1 V
PP
1.5 GHz
Slew rate (differential) 3500 V/μs
Rise time 0.25
Fall time 2-V step 0.25
ns
Settling time to 1% 1
Settling time to 0.1% 10
f = 10 MHz –107
2nd-order harmonic distortion f = 50 MHz –83 dBc
f = 100 MHz –60
f = 10 MHz –87 C
3rd-order harmonic distortion f = 50 MHz –65 dBc
f = 100 MHz –54
f
C
= 70 MHz –77
2nd-order intermodulation distortion
f
C
= 140 MHz –54
200-kHz tone spacing,
dBc
R
L
= 499
f
C
= 70 MHz –77
3rd-order intermodulation distortion
f
C
= 140 MHz –62
f
C
= 70 MHz 72
2nd-order output intercept point
f
C
= 140 MHz 52
200-kHz tone spacing
dBm
R
L
= 100
f
C
= 70 MHz 38.5
3rd-order output intercept point
f
C
= 140 MHz 30
f
C
= 70 MHz 2.2
1-dB compression point dBm
f
C
= 140 MHz 0.25
Noise figure 50 system, 10 MHz 17.1 dB
Input voltage noise f > 10 MHz 1.9 nV/Hz
Input current noise f > 10 MHz 2.2 pA/Hz
DC PERFORMANCE
Open-loop voltage gain (A
OL
) 68 dB
Input offset voltage T
A
= +25°C 1 mV
Average offset voltage drift T
A
= –40°C to +85°C 2.6 μV/°C
Input bias current T
A
= +25°C 6 μA C
Average bias current drift T
A
= –40°C to +85°C 20 nA/°C
Input offset current T
A
= +25°C 1.6 μA
Average offset current drift T
A
= –40°C to +85°C 4 nA/°C
(1) Test levels: (A) 100% tested at +25°C. Over-temperature limits by characterization and simulation. (B) Limits set by characterization and
simulation. (C) Typical value only for information.
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