Datasheet

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SBFS026B − JUNE 2004 − REVISED SEPTEMBER 2007
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2
ABSOLUTE MAXIMUM RATINGS
(1)
Core Supply Voltage
VDD18 −0.3V to +2.0V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
VDD33 −0.3V to +4.0V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital I/O Supply Voltage, V
IO
−0.3V to +4.0V. . . . . . . . . . . . . . . .
Digital Input Voltage −0.3V to +4.0V. . . . . . . . . . . . . . . . . . . . . . . . .
Operating Case Temperature Range, T
C
−40°C to +85°C. . . . . . . .
Storage Temperature Range, T
STG
−65°C to +150°C. . . . . . . . . . .
(1)
Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods
may degrade device reliability. These are stress ratings only, and
functional operation of the device at these or any other conditions
beyond those specified is not supported.
This integrated circuit can be damaged by ESD. Texas
Instruments recommends that all integrated circuits be
handled with appropriate precautions. Failure to observe
proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to
complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum located at the end of this data
sheet.
ELECTRICAL CHARACTERISTICS
All specifications at T
A
= +25°C, VDD33 = +3.3V, V
IO
= +3.3V, REGEN = High, and VDD18 floating, unless otherwise noted.
SRC4184
PARAMETER CONDITIONS MIN TYP MAX UNITS
DYNAMIC PERFORMANCE
Resolution 24 Bits
Input Sampling Frequency, f
sIN
4 212 kHz
Output Sampling Frequency, f
sOUT
4 212 kHz
INPUT/OUTPUT SAMPLING RATIO
Upsampling 1:16
Downsampling 16:1
DYNAMIC RANGE BW = 20Hz to f
sOUT
/2, −60dBFS Input
f
IN
= 1kHz, A-Weighted
44.1kHz:48kHz 128 dB
48kHz:44.1kHz 128 dB
48kHz:96kHz 128 dB
44.1kHz:192kHz 128 dB
96kHz:48kHz 128 dB
192kHz:12kHz 128 dB
192kHz:32kHz 128 dB
192kHz:48kHz 128 dB
32kHz:48kHz 128 dB
12kHz:192kHz 128 dB
TOTAL HARMONIC DISTORTION + NOISE BW = 20Hz to f
sOUT
/2, −60dBFS Input
f
IN
= 1kHz, Unweighted
44.1kHz:48kHz −125 dB
48kHz:44.1kHz −125 dB
48kHz:96kHz −125 dB
44.1kHz:192kHz −125 dB
96kHz:48kHz −125 dB
192kHz:12kHz −125 dB
192kHz:32kHz −125 dB
192kHz:48kHz −125 dB
32kHz:48kHz −125 dB
12kHz:192kHz −125 dB
Interchannel Gain Mismatch 0 dB
Interchannel Phase Deviation 0 degrees
(1)
Dynamic performance is measured with an Audio Precision System Two Cascade or Cascade Plus test system.
(2)
f
sMIN
= min (f
sIN
, f
sOUT
).
(3)
f
sMAX
= max (f
sIN
, f
sOUT
).
(4)
Power-supply current for power-down modes is measured without loading.
(5)
Dynamic current is measured with active loading and the excercized output pins equal to ±2mA.