Datasheet
SLLS318D − NOVEMBER 1998 − REVISED NOVEMBER 2007
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
V
ID
AP
AM
V
IAM
V
IAP
V
IC
(V
IAP
+ V
IAM
)/2
Figure 2. Voltage Definitions
CLKIN/CLKOUT
D0, D6, D12
D1, D7, D13
D2, D8, D14
D3, D9, D15
D18, D19, D20
ALL OTHERS
NOTE A: The 16-grayscale test-pattern test device power consumption for a typical display pattern.
Figure 3. 16-Grayscale Test-Pattern Waveforms
t
c
NOTE A: The worst-case test pattern produces nearly the maximum switching frequency for all of the LVTTL outputs.
CLKIN/CLKOUT
Even Dn
Odd Dn
Figure 4. Worst-Case Test-Pattern Waveforms