Datasheet

CLKIN
D0,8,16
D1,9,17
D2,10,18
D3,11,19
D4-7,12-15,20-23
D24-27
T
CLKIN
EVENDn
ODDDn
t
7
t
0
t
1
t
2
t
3
t
4
t
5
t
6
CLKIN
CLKOUT
Yn
V
OD(L)
0.00V
t
0-6
t
7
1.40V
~2.5V
~0.5V
CLKIN
CLKOUT
or Yn
V
OD(H)
SN75LVDS83B
SLLS846B –MAY 2009–REVISED SEPTEMBER 2011 www.ti.com
PARAMETER MEASUREMENT INFORMATION (continued)
The 16 grayscale test pattern test device power consumption for a typical display pattern.
Figure 5. 16 Grayscale Test Pattern
The worst-case test pattern produces nearly the maximum switching frequency for all of the LVDS outputs.
Figure 6. Worst-Case Power Test Pattern
CLKOUT is shown with CLKSEL at high-level.
CLKIN polarity depends on CLKSEL input level.
Figure 7. SN75LVDS83B Timing Definitions
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