Datasheet

10" FR4
LVCP422
Jitter
Measurement
Point
6" FR4
Jitter Measurement
Setup
*Signal
Source
*Signal
Source
Jitter
Measurement
Point
*Source Jitte r Mea sure me nts (ps)
Total Jitt er 32pp
Deterministic Jitt er 8pp
Random Jit ter 1.7rms
SN75LVCP422
www.ti.com ................................................................................................................................................................................................... SLLS972 – MARCH 2009
ELECTRICAL CHARACTERISTICS (continued)
over recommended operating conditions (unless otherwise noted)
PARAMETER CONDITIONS MIN TYP MAX UNITS
T
skewTX
Differential skew Difference between the single-ended mid-point of the 7 20 ps
TX+ signal rising/falling edge and the single-ended
mid-point of the TX – signal falling/rising edge
JITTER (with pre-emphasis disabled; measured at device pin + 2 " loadboard trace)
TJ
TX
Total jitter
(1)
UI = 333 ps, +K28.5 control character; D1/D0 = 0 V 30 67 ps-pp
DJ
TX
Deterministic jitter
(1)
UI = 333 ps, +K28.5 control character; D1/D0 = 0 V 10 33 ps-pp
RJ
TX
Random jitter
(1)
UI = 333 ps, +K28.7 control character; D1/D0 = 0 V 1.7 2.0 ps-rms
JITTER (with pre-emphasis enabled; measured as shown in Figure 2 )
TJ
TX
Total jitter
(1)
UI = 333 ps, +K28.5 control character; D1/D0 = VCC 60 100 ps-pp
DJ
TX
Deterministic jitter
(1)
UI = 333 ps, +K28.5 control character; D1/D0 = VCC 33 67 ps-pp
RJ
TX
Random jitter
(1)
UI = 333 ps, +K28.7 control character; D1/D0 = VCC 1.7 2.0 ps-rms
(1) T
J
= (14.1 × RJ
SD
+ DJ) where RJ
SD
is one standard deviation value of RJ Gaussian distribution. T
J
measurement is at the SATA
connector and includes jitter generated at the package connection on the printed circuit board and at the board interconnect.
Figure 2. Output Jitter Measurement Test Setup
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