Datasheet

SN75LBC241
LOW-POWER LinBiCMOS MULTIPLE DRIVERS AND RECEIVERS
SLLS137F MAY 1992 REVISED FEBRUARY 2001
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
TEST CIRCUIT VOLTAGE WAVEFORMS
C
L
= 50 pF
(see Note B)
R
L
= 1.3 k
0 V
3 V
Output
Input
V
OL
V
OH
t
PHL(R)
Generator
(see Note A)
t
PLH(R)
500 ns
10 ns10 ns
V
CC
NOTES: A. The pulse generator has the following characteristics: Z
O
= 50 , duty cycle 50%.
B. C
L
includes probe and jig capacitance.
C. All diodes are 1N3064 or equivalent.
RIN
ROUT
See Note C
90%90%
50% 50%
10% 10%
1.5 V1.5 V
Figure 1. Receiver Test Circuit and Waveforms for t
PHL
and t
PLH
Measurement
C
L
= 10 pF
(see Note B)
TEST CIRCUIT VOLTAGE WAVEFORMS
Output
V
OL
V
OH
t
PHL
t
TLH
Generator
(see Note A)
R
L
RS-232
Output
t
PLH
t
THL
5 µs
0 V
NOTES: A. The pulse generator has the following characteristics: Z
O
= 50 , duty cycle 50%.
B. C
L
includes probe and jig capacitance.
TIN
TOUT
3 V
Input
10 ns10 ns
90%90%
50% 50%
10% 10%
90%
90%
10%
10%
Figure 2. Driver Test Circuit and Waveforms for t
PHL
and t
PLH
Measurement (5-µs Input)
NOTES: A. The pulse generator has the following characteristics: Z
O
= 50 , duty cycle 50%.
B. C
L
includes probe and jig capacitance.
SR
6V
t
THL
or t
TLH
C
L
(see Note B)
TEST CIRCUIT
Generator
(see Note A)
R
L
RS-232
Output
VOLTAGE WAVEFORMS
0 V
3 V
Output
Input
V
OL
V
OH
t
THL
t
TLH
20 µs
10 ns10 ns
90%90%
1.5 V 1.5 V
10% 10%
3 V
3 V
3 V 3 V
Figure 3. Test Circuit and Waveforms for t
THL
and t
TLH
Measurement (20-µs Input)