Datasheet
V
I
= A sin2 ft
1MHz<f<50MHz
100nF
2.2kΩ
V
offset
=
−2Vto7V
50 Ω
50 Ω
470nF
RE
R
DE
D
Scope
V
R
2.2kΩ
V
CC
100nF
GND
A
B
Scope
V
R
shallbegreaterthan
2Vthroughoutthistest.
50 Ω
Signal
Generator
C
L
=15pF
50 Ω
Signal
Generator
A
V
ID
B
R
I
O
V
O
50%
90%
10%
1.5V
0V
V
OH
V
OL
t
PLH
t
PHL
t
r
t
f
InputB
Input A
Output
1.5V
V
ID
V
A
V
B
I
O
A
B
I
B
V
O
R
I
A
V
IC
V
A
+V
B
2
60
250
135
I
OS
Voltage
Source
V
OS
Output
Current|mA|
t
(CFB)
t
(TSD)
time
D
SN65HVD1176
SN75HVD1176
SLLS563F –JULY 2003–REVISED JUNE 2013
www.ti.com
PARAMETER MEASUREMENT INFORMATION (continued)
Figure 8. Driver Short-Circuit Test Circuit and Waveforms (Short Circuit applied at Time t = 0)
Figure 9. Receiver DC Parameter Definitions
Figure 10. Receiver Switching Test Circuit and Waveforms
Figure 11. Receiver Common-Mode Rejection Test Circuit
8 Submit Documentation Feedback Copyright © 2003–2013, Texas Instruments Incorporated
Product Folder Links: SN65HVD1176 SN75HVD1176