Datasheet

SN54LVTH18646A, SN54LVTH182646A, SN74LVTH18646A, SN74LVTH182646A
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT TRANSCEIVERS AND REGISTERS
SCBS311D – MARCH 1994 – REVISED JUNE 1997
32
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH182646A SN74LVTH182646A
UNIT
PARAMETER
TEST
CONDITIONS
MIN TYP
MAX MIN TYP
MAX
UNIT
V
IK
V
CC
= 2.7 V, I
I
= –18 mA –1.2 –1.2 V
V
CC
= MIN to MAX
, I
OH
= –100 µA V
CC
–0.2 V
CC
–0.2
V
CC
= 2.7 V, I
OH
= –3 mA 2.4 2.4
V
OH
I
OH
= –8 mA
A port, TDO
2.4 2.4
V
V
OH
V
CC
=3V
I
OH
= –24 mA 2
V
V
CC
=
3
V
I
OH
= –32 mA 2
I
OH
= –12 mA B port 2 2
V
CC
=27V
I
OL
= 100 µA 0.2 0.2
V
CC
=
2
.
7
V
I
OL
= 24 mA 0.5 0.5
I
OL
= 16 mA
A
p
ort TDO
0.4 0.4
V
OL
I
OL
= 32 mA
A
port
,
TDO
0.5 0.5
V
V
CC
= 3 V
I
OL
= 48 mA 0.55
I
OL
= 64 mA 0.55
I
OL
= 12 mA B port 0.8 0.8
V
CC
= 3.6 V, V
I
= V
CC
or GND
CLK
,
DIR
,
±1 ±1
V
CC
= 0 or MAX
, V
I
= 5.5 V
CLK,
DIR,
S, TCK
10 10
V
I
= 5.5 V
OE TDI
50 50
I
I
V
I
= V
CC
OE, TDI,
TMS
1 1
µA
I
I
V
CC
=36V
V
I
= 0
TMS
–25 –100 –25 –100
µ
A
V
CC
=
3
.
6
V
V
I
= 5.5 V
§
20 20
V
I
= V
CC
A or B ports
§
1 1
V
I
= 0 –5 –5
I
off
V
CC
= 0, V
I
or V
O
= 0 to 4.5 V ±100 µA
I
V
CC
=3V
V
I
= 0.8 V
AorB
p
orts
75 150 500 75 150 500
µA
I
I(hold)
V
CC
=
3
V
V
I
= 2 V
A
or
B
ports
–75 –150 –500 –75 –150 –500
µ
A
I
OZH
V
CC
= 3.6 V, V
O
= 3 V TDO 1 1 µA
I
OZL
V
CC
= 3.6 V, V
O
= 0.5 V TDO –1 –1 µA
I
OZPU
V
CC
= 0 to 1.5 V, V
O
= 0.5 V or 3 V TDO ±50 ±50 µA
I
OZPD
V
CC
= 1.5 V to 0, V
O
= 0.5 V or 3 V TDO ±50 ±50 µA
V
CC
=
3.6 V,
Outputs high 0.6 2 0.6 2
I
CC
V
CC
=
3
.
6
V
,
I
O
= 0,
Outputs low 20 24 20 24
mA
V
I
= V
CC
or GND
Outputs disabled 0.6 2 0.6 2
I
CC
#
V
CC
= 3 V to 3.6 V, One input at V
CC
– 0.6 V,
Other inputs at V
CC
or GND
0.5 0.5 mA
C
i
V
I
= 3 V or 0 4 4 pF
C
io
V
O
= 3 V or 0 10 10 pF
C
o
V
O
= 3 V or 0 8 8 pF
All typical values are at V
CC
= 3.3 V, T
A
= 25°C.
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions.
§
Unused pins at V
CC
or GND
The parameter I
I(hold)
includes the off-state ouput leakage current.
#
This is the increase in supply current for each input that is at the specified TTL voltage level rather than V
CC
or GND.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.