Datasheet

SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670C – AUGUST 1996 – REVISED MARCH 1998
29
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
recommended operating conditions (see Note 4)
SN54LVTH182514 SN74LVTH182514
UNIT
MIN MAX MIN MAX
UNIT
V
CC
Supply voltage 2.7 3.6 2.7 3.6 V
V
IH
High-level input voltage 2 2 V
V
IL
Low-level input voltage 0.8 0.8 V
V
I
Input voltage 5.5 5.5 V
I
OH
High level out
p
ut current
A port, TDO –24 –32
mA
I
OH
High
-
le
v
el
o
u
tp
u
t
c
u
rrent
B port –12 –12
mA
I
OL
Low level out
p
ut current
A port, TDO 24 32
mA
I
OL
Lo
w-
le
v
el
o
u
tp
u
t
c
u
rrent
B port 12 12
mA
I
OL
†
Low-level output current A port, TDO 48 64 mA
∆t/∆v Input transition rise or fall rate Outputs enabled 10 10 ns/V
T
A
Operating free-air temperature –55 125 –40 85 °C
†
Current duty cycle ≤ 50%, f ≥ 1 kHz
NOTE 4: All unused control inputs of the device must be held at V
CC
or GND to ensure proper device operation. Refer to the TI application report,
Implications of Slow or Floating CMOS Inputs , literature number SCBA004.
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